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  3. Atomic Force Microscopes
  4. Park FX40 automated atomic force microscope equipped with next-generation new features (Park Systems Japan Co., Ltd.)
Park FX40 automated atomic force microscope equipped with next-generation new features-FX40
Park FX40 automated atomic force microscope equipped with next-generation new features-Park Systems Japan Co., Ltd.

Park FX40 automated atomic force microscope equipped with next-generation new features
Park Systems Japan Co., Ltd.

Park Systems Japan Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.4hours

Relatively Fast Response

About This Product

■Next-generation technology to accelerate research and development

・Adopts the first dual camera system in research AFM history ・Automatic optimization function using machine learning

■Read probe information

Scan the QR code on the chip carrier with a camera to obtain all necessary information such as probe, model, compatible applications, and usage. This feature allows you to automatically select the most suitable probe.

■Automatic probe exchange

By utilizing a cassette containing eight probes and a magnetic control mechanism, automatic probe replacement is possible without user intervention.

■Automatic laser alignment

Automatic laser alignment automatically adjusts the position of the laser and PSPD to the optimal position, enabling clear imaging without distortion.

■Flat orthogonal XY scan without bowing

Park's crosstalk-free scanner structure enables flat orthogonal XY scanning regardless of scan position, scan rate, or scan size. No background curvature is observed, even with extremely flat samples such as optical flats, and with various scan offsets. This enables highly accurate and precise nanometer measurements to meet even the most challenging research and engineering challenges.

■Industry-leading low noise Z detector

Park's AFM is equipped with a low-noise Z detector that achieves noise below 0.02nm over a wide band. This allows for highly accurate topography and no edge overshoot. Save time during scanning and get more accurate data at the same time.

■True non-tact™ mode

True Non-Tact™ mode enables contactless measurements and prevents tip and sample damage during scanning. This is Park AFM's unique scan mode that enables high-resolution and high-precision data.

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    Park FX40 automated atomic force microscope equipped with next-generation new features

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1 Models of Park FX40 automated atomic force microscope equipped with next-generation new features

Image Part Number Price (excluding tax)
Park FX40 automated atomic force microscope equipped with next-generation new features-Part Number-FX40

FX40

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About Company Handling This Product

Park Systems Japan Co., Ltd.

Response Rate

100.0%

Response Time

26.4hrs

  • Japan

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Atomic Force Microscopes　Park Systems Japan Co., Ltd.
Park Systems Japan Co., Ltd.

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