UV-visible spectrophotometer OSK 75QF T7
Ogawa Seiki Co., Ltd.
About This Product
■Features
・High-speed scanning – Wavelength drive speed up to 1,000nm/min.
・Photometric measurement, quantitative measurement, spectral scanning, 3D presentation/DNA/protein analysis, etc. are possible through software.
・Management settings that comply with GLP/GMP/GRP can be configured upon request.
- Extensive management features with detailed audit trail.
・21CFR Part 11 compliant (electronic records/electronic signature function)
- High degree of automation requires the operator to press only two keys when measuring typical samples.
-Many optional accessories enhance the instrument's flexibility and measurement range.
-Simple mechanical structure and modular electrical design facilitate daily maintenance.
- Deuterium lamps and tungsten lamps can be easily replaced and are supplied pre-conditioned.
・Equipped with an electric automatic 5/8 cell holder as standard, which is especially useful for quantifying pesticides, etc.
-
Product
UV-visible spectrophotometer OSK 75QF T7
-
Handling Company
Ogawa Seiki Co., Ltd.
-
Categories
2 Models of UV-visible spectrophotometer OSK 75QF T7
Items marked with have different values depending on the model number.
Click on the part number for more information about each product
| Product Image | Part Number | Price (excluding tax) | Baseline flatness | Baseline stability | Dimensions W*D*H | Light receiving optical system | Metering mode | Photometric accuracy | Photometric noise | Photometric reproducibility | Photometry range | Software support | Spectral bandwidth | Stray light | Wavelength accuracy | Wavelength range | Wavelength reproducibility | Weight | Working mode |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
OSK 75QF T7 |
Available upon quote | ±0.002Abs (190~1,100nm) | 0.001Abs/h (500nm, 0Abs 2nm spectral bandwidth, 2 hours warm-up) | 690X540X540mm | Split beam monitoring ratio system | Transmittance, absorption, energy |
±0.002Abs (0~0.5A) ±0.004Abs (0.5~1A) ±0.3%T (0~100%T) |
±0.001Abs (500nm,0Abs 2nm spectral frequency band) |
≦0.001A (0~0.5A) ≦0.002A (0.5~1A) ≦0.15%T (0~100%T) |
-0.3~3Abs | MPU Software Platform/Spec UV software workstation | 2nm (fixed slit) | <0.12%T (220nm,Nal;340nm,NaNo₂) | ±0.3nm (automatic wavelength correction) | 190~1,100nm | 0.2nm | 25kg | MPU mode/PC mode |
|
|
OSK 75QF T7S |
Available upon quote | ±0.002Abs (190~1,100nm) | 0.001Abs/h (500nm, 0Abs 2nm spectral bandwidth, 2 hours warm-up) | 690X540X540mm | Split beam monitoring ratio system | Transmittance, absorption, energy |
±0.002Abs (0~0.5A) ±0.004Abs (0.5~1A) ±0.3%T (0~100%T) |
±0.001Abs (500nm,0Abs 2nm spectral frequency band) |
≦0.001A (0~0.5A) ≦0.002A (0.5~1A) ≦0.15%T (0~100%T) |
-0.3~3Abs | MPU Software Platform/Spec UV software workstation | 0.5,1,2,5nm (variable slit) | <0.12%T (220nm,Nal;340nm,NaNo₂) | ±0.3nm (automatic wavelength correction) | 190~1,100nm | 0.2nm | 25kg | MPU mode/PC mode |
Click on the part number for more information about each product
Customers who viewed this product also viewed
Other products of Ogawa Seiki Co., Ltd.
View more products of Ogawa Seiki Co., Ltd.
About Company Handling This Product
- Japan