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UV-visible spectrophotometer OSK 75QF T6Handling Company
Ogawa Seiki Co., Ltd.Categories
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Image | Part Number | Price (excluding tax) | Weight | Stray light | Photometric accuracy | Photometry range | Photometric reproducibility | Photometric noise | Wavelength accuracy | Wavelength range | Wavelength reproducibility | Dimensions W*D*H | Light receiving optical system | Baseline flatness | Baseline stability | Spectral bandwidth |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
OSK 75QF T6U |
Available upon quote |
11kg |
≦0.05%T |
±0.002Abs (0~0.5A) |
-0.3~3Abs |
≦0.001A (0~0.5A) |
±0.001A (500nm,p-p), 30 minutes warm up |
±1nm |
190~1,100nm |
≦0.2nm |
476×362×225mm |
Split beam monitoring ratio system |
±0.002A (200~1,000nm) |
≦0.001A/h (500nm,0Abs), 2 hours warm-up |
2nm |
|
OSK 75QF T6V |
Available upon quote |
11kg |
≦.1%T |
±0.002Abs (0~0.5A) |
-0.3~3A |
≦0.001A (0~0.5A) |
±0.001A (500nm,p-p), 30 minutes warm up |
±2nm |
Wavelength range |
≦0.4nm |
476×362×225mm |
Split beam monitoring ratio system |
±0.002A (325~1,000nm) |
≦0.001A/h (500nm,0Abs), 2 hours warm-up |
2nm |
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