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Nanoscale infrared spectroscopy system integrated AFM Icon-IR-Icon-IR
Nanoscale infrared spectroscopy system integrated AFM Icon-IR-Sanko Ematech Co., Ltd.

Nanoscale infrared spectroscopy system integrated AFM Icon-IR
Sanko Ematech Co., Ltd.

Sanko Ematech Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

38.3hours


About This Product

■Features

・In addition to mechanical and electrical property technologies, nanoscale infrared spectroscopy is realized in a single system. ・Supports large samples ・High performance 10nm or less

■AFM option

・Thermal analysis options: Scanning suggestive thermal microscopy (VITA SThM), local thermal analysis (VITA nanoTA) ・Mechanical property options: High-speed elastic modulus mapping (PeakForce QNM HA), dynamic mechanical properties measurement (NDMA), DMA up to 300Hz with heater (AFM-nDMA 300Hz), DMA range extended to 20kHz (AFM-nDMA 20kHz) , Contact resonance viscoelastic mapping + QNM (FFV-CR with QNM-HR) ・Electrical properties options: Ultra-low current measurement + QNM (PeakForce TUNA with QNM), Ultra-low current measurement (CAFM), Scanning capacitance microscope (SCM), Scanning spreading resistance microscope (SSRM), Scanning microwave impedance microscope ( sMIM2.0), surface potential measurement + QNM (KPFM with QNM), surface potential measurement (KPFM-U) , DCUBETUNA/DCUBESCM/DCUBE SSRM/DCUBE sMIM/DCUBE PFM

  • Product

    Nanoscale infrared spectroscopy system integrated AFM Icon-IR

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1 Models of Nanoscale infrared spectroscopy system integrated AFM Icon-IR

Image Part Number Price (excluding tax) Selectable IR laser Standard image mode Standard IR mode Laser type Manufacturer Scan range Z noise floor
Nanoscale infrared spectroscopy system integrated AFM Icon-IR-Part Number-Icon-IR

Icon-IR

Available upon quote

Mid-infrared CW/P laser 1,900~2,600cm-1 (Kaiser), Mid-infrared OPO laser 2,700~3,600cm-1 (Kaiser)

PeakForce Tapping, Contact Tapping, FAST Tapping Force Curves, Force modulation

Contact AFM-IR, Resonance Enhanced AFM-IR, Tapping AFM-IR, Surface Sensitive AFM-IR

QCL 780~1,800cm-1 (Kaiser), OPO 1,900~2,600cm-1 (Kaiser), QCL 2,700~3,600cm-1 (Kaiser)

Bruker Japan Co., Ltd.

XY 90μm

<50pm RMS

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About Company Handling This Product

Response Rate

100.0%


Response Time

38.3hrs


Company Review

5.0
  • Japan

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