Atomic force microscope (material AFM) small platform
Bruker Corporation

Atomic force microscope (material AFM) large platform Dimension series

Bruker Corporation

5.0

170+ people viewing

Last viewed: 37 minutes ago

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32 models listed

Ultra-high vacuum cryogenic scanning probe microscope system USM1200

Unisoku Co., Ltd.

830+ people viewing

Last viewed: 4 hours ago

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2 models listed

The most accurate and easy-to-use atomic force microscope (AFM) Park NX10

Park Systems Japan Co., Ltd.

1570+ people viewing

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3 models listed

Scanning Probe Microscope Ultra High Vacuum Cryogenic High Magnetic Field Scanning Tunneling Microscope System USM1300

Unisoku Co., Ltd.

850+ people viewing

Last viewed: 8 hours ago

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2 models listed

The most economical research grade AFM Park NX7 with flexible sample handling

Park Systems Japan Co., Ltd.

740+ people viewing

Last viewed: 10 hours ago

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2 models listed

Ultra-high vacuum cryogenic scanning probe microscope system USM1400

Unisoku Co., Ltd.

840+ people viewing

Last viewed: 7 hours ago

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2 models listed

Bio AFM (atomic force microscope) optical tweezers

Bruker Corporation

5.0

290+ people viewing

Last viewed: 6 hours ago

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6 models listed

Ultra-high vacuum low temperature strong magnetic field scanning probe microscope USM1500

Unisoku Co., Ltd.

720+ people viewing

Last viewed: 5 hours ago

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2 models listed

Scanning Probe Microscope Dilution Refrigeration Ultra High Vacuum Ultra Low Temperature Strong Magnetic Field Scanning Tunneling Microscope System USM1600

Unisoku Co., Ltd.

590+ people viewing

Last viewed: 6 hours ago

Response time: 22.85 hours

2 models listed

Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope

Oxford Instruments Ltd.

5.0

880+ people viewing

Last viewed: 59 minutes ago

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3 models listed

Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P

Unisoku Co., Ltd.

740+ people viewing

Last viewed: 1 hour ago

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2 models listed

Significantly improve productivity with highly versatile AFM Park NX20 Lite

Park Systems Japan Co., Ltd.

820+ people viewing

Last viewed: 3 hours ago

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2 models listed

Atomic force microscope (material AFM) large platform Dimension series

Bruker Corporation

5.0

170+ people viewing

Last viewed: 37 minutes ago

Response time: 33.51 hours

32 models listed

Atomic force microscope (material AFM) options

Bruker Corporation

5.0

180+ people viewing

Last viewed: 4 seconds ago

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2 models listed

Bio AFM (Atomic Force Microscope) Automated Force Spectroscopy

Bruker Corporation

5.0

130+ people viewing

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7 models listed

Bio AFM (atomic force microscope) optical tweezers

Bruker Corporation

5.0

290+ people viewing

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6 models listed

Nanoscale infrared spectroscopy system

Bruker Corporation

5.0

220+ people viewing

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12 models listed

AFM / SPM / nanoIR probe

Bruker Corporation

5.0

130+ people viewing

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6 models listed

Nanomechanical property evaluation system Platform type nanoindenter

Bruker Corporation

5.0

180+ people viewing

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3 models listed

Electron microscope built-in nanoindentation system SEM/TEM in-situ nanoindenter

Bruker Corporation

5.0

190+ people viewing

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4 models listed

Multifunctional friction and wear tester UMT TriboLab

Bruker Corporation

5.0

880+ people viewing

Response time: 33.51 hours

3 models listed

Contour SP, white light interference microscope compatible with large substrates

Bruker Corporation

5.0

700+ people viewing

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2 models listed

300mm compatible fully automatic white light interference microscope Contour GTX-ARM

Bruker Corporation

5.0

1050+ people viewing

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2 models listed

General purpose stylus profiling system Dektak XT

Bruker Corporation

5.0

240+ people viewing

Last viewed: 13 hours ago

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