Atomic force microscope (material AFM) large platform Dimension series-Dimension XR Nano Mechanics
Atomic force microscope (material AFM) large platform Dimension series-Dimension HPI
Atomic force microscope (material AFM) large platform Dimension series-Dimension FastScan
Atomic force microscope (material AFM) large platform Dimension series-Dimension Icon
Atomic force microscope (material AFM) large platform Dimension series-Dimension Edge
Atomic force microscope (material AFM) large platform Dimension series-Bruker Corporation

Atomic force microscope (material AFM) large platform Dimension series
Bruker Corporation


About This Product

■Dimension series Bruker's Dimension Icon® atomic force microscopy (AFM) system provides the highest performance, functionality, and productivity for nanoscale researchers in science, technology, and industry. Based on the world's most used large sample AFM platform, the latest Dimension system is an industry-leading system built on decades of innovation and customer feedback. The system is designed to provide innovative low drift and low noise, allowing users to obtain artifact-free images in minutes instead of hours. Dimension Icon is equipped with exclusive ScanAsyst® automatic image optimization technology for easier, faster and more consistent results, regardless of your skill level. It makes it easier than ever to achieve the highest level of AFM research with high productivity. Scanner (chip scan method) ■Icon Scan Head (5thGen) ・The unique closed-loop sensor design achieves low noise comparable to open-loop sensors, which was not possible with large sample/chip scan AFM. - Significantly reduced noise floor allows imaging at the atomic level in Contact mode and below 30pm in Tapping mode. ・High-resolution camera and X-Y positioning enable faster and more efficient sample navigation - Compatible with various latest optional modules such as mechanical property evaluation, electrical property evaluation, and scanning electrochemical microscope, expanding research possibilities. ■FastScan Head ・By suppressing the drift of the closed-loop scanner to the utmost limit, we have achieved a low vertical noise of less than 40 pm. - You can obtain high-speed survey images at 125Hz or higher, Tapping mode 20Hz, and PeakForceTapping Hz to obtain high-speed and high-quality images. -Equipped with automatic laser alignment function to make operation easier.

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    Atomic force microscope (material AFM) large platform Dimension series

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8 Models of Atomic force microscope (material AFM) large platform Dimension series

Items marked with have different values depending on the model number.

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Product Image Part Number Price (excluding tax)
Atomic force microscope (material AFM) large platform Dimension series-Part Number-Dimension XR Nano Mechanics

Dimension XR Nano Mechanics

Available upon quote
Atomic force microscope (material AFM) large platform Dimension series-Part Number-Dimension XR NanoElectrical

Dimension XR NanoElectrical

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Atomic force microscope (material AFM) large platform Dimension series-Part Number-Dimension XR NanoElectroChemical

Dimension XR NanoElectroChemical

Available upon quote
Atomic force microscope (material AFM) large platform Dimension series-Part Number-Dimension HPI

Dimension HPI

Available upon quote
Atomic force microscope (material AFM) large platform Dimension series-Part Number-Dimension Pro

Dimension Pro

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Atomic force microscope (material AFM) large platform Dimension series-Part Number-Dimension FastScan

Dimension FastScan

Available upon quote
Atomic force microscope (material AFM) large platform Dimension series-Part Number-Dimension Icon

Dimension Icon

Available upon quote
Atomic force microscope (material AFM) large platform Dimension series-Part Number-Dimension Edge

Dimension Edge

Available upon quote

Click on the part number for more information about each product

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Bruker Corporation

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