Atomic force microscope (material AFM) large platform Dimension series-Dimension XR Nano Mechanics

Atomic force microscope (material AFM) large platform Dimension series-Dimension HPI

Atomic force microscope (material AFM) large platform Dimension series-Dimension FastScan

Atomic force microscope (material AFM) large platform Dimension series-Dimension Icon

Atomic force microscope (material AFM) large platform Dimension series-Dimension Edge

Atomic force microscope (material AFM) large platform Dimension series
Bruker Corporation

Bruker Corporation's Response Status

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About This Product

■Dimension seriesBruker's Dimension Icon® atomic force microscopy (AFM) system provides the highest performance, functionality, and productivity for nanoscale researchers in science, technology, and industry. Based on the world's most used large sample AFM platform, the latest Dimension system is an industry-leading system built on decades of innovation and customer feedback.

The system is designed to provide innovative low drift and low noise, allowing users to obtain artifact-free images in minutes instead of hours. Dimension Icon is equipped with exclusive ScanAsyst® automatic image optimization technology for easier, faster and more consistent results, regardless of your skill level.

It makes it easier than ever to achieve the highest level of AFM research with high productivity.

Scanner (chip scan method)
■Icon Scan Head (5thGen)・The unique closed-loop sensor design achieves low noise comparable to open-loop sensors, which was not possible with large sample/chip scan AFM.
- Significantly reduced noise floor allows imaging at the atomic level in Contact mode and below 30pm in Tapping mode.
・High-resolution camera and X-Y positioning enable faster and more efficient sample navigation
- Compatible with various latest optional modules such as mechanical property evaluation, electrical property evaluation, and scanning electrochemical microscope, expanding research possibilities.

■FastScan Head・By suppressing the drift of the closed-loop scanner to the utmost limit, we have achieved a low vertical noise of less than 40 pm.
- You can obtain high-speed survey images at 125Hz or higher, Tapping mode 20Hz, and PeakForceTapping Hz to obtain high-speed and high-quality images.
-Equipped with automatic laser alignment function to make operation easier.

Model
There are 8 models for this product.

Product
Atomic force microscope (material AFM) large platform Dimension series

Handling Company
Bruker Corporation

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Measuring Equipment

Coordinate Measuring Machines

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8 Models of Atomic force microscope (material AFM) large platform Dimension series

Click on the part number for more information about each product

Image	Part Number	Price (excluding tax)
	Dimension XR Nano Mechanics	Available upon quote
	Dimension XR NanoElectrical	Available upon quote
	Dimension XR NanoElectroChemical	Available upon quote
	Dimension HPI	Available upon quote
	Dimension Pro	Available upon quote
	Dimension FastScan	Available upon quote
	Dimension Icon	Available upon quote
	Dimension Edge	Available upon quote

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About Company Handling This Product

Bruker Corporation

Response Rate

100.0%

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30.7hrs

Company Overview

Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific...

United States of America

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Atomic force microscope (material AFM) large platform Dimension series Bruker Corporation

Bruker Corporation's Response Status

About This Product

■Dimension series

■Icon Scan Head (5thGen)

■FastScan Head

8 Models of Atomic force microscope (material AFM) large platform Dimension series

Customers who viewed this product also viewed

Other products of Bruker Corporation

About Company Handling This Product

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Atomic force microscope (material AFM) large platform Dimension series
Bruker Corporation