SiC microscopic observation device SCM-100-SCM-100

SiC microscopic observation device SCM-100
Photoscience Co., Ltd.

Photoscience Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

2.2hours

Very Fast Response

About This Product

■SummaryGaN and SiC are attracting attention as next-generation power semiconductors because they reduce power loss by half and are lightweight. Crystal defects are a problem with SiC power devices, but by using the SCM-100, you can quickly observe and sort them.
　
The SCM-100 has the function of applying a pre-programmed current to the built-in diode of the transistor of the SiC sample. This is a device that can detect defects by photographing them with a camera attached to a microscope, since areas where current does not flow (defects) do not emit light when current is applied. The SiC sample surface is magnified with a microscope and the visible light emission is monitored with a camera, allowing for in-situ observation of defect growth.

Images can be taken and saved at optimal intervals. By using the optional Peltier cooling water cooling unit, the temperature of the SiC device sample stage can be kept below 80℃.

■Features・Photograph the microscopic image of the SiC sample using a camera and output it to the LCD in real time.
・Maximum number of shots: 999 shots at shooting intervals of 3 seconds to 24 hours, can be saved on SD card
・Output voltage, output current, and status information can be sampled at the fastest of 0.1 seconds
・One PC can control 5 power supplies and save data
・When outputting to a 17-inch LCD, observation magnification is approximately 60x to approximately 200x
- Capable of in-situ observation of defect growth in SiC samples

■ApplicationsSiC device

■Product usage examplesYou can manage up to 5 power supplies with one software and start them simultaneously. It is possible to display Vmeas (V) and Imeas (A) in real time. Results are saved in Excel.

Model
There are 1 models for this product.

Product
SiC microscopic observation device SCM-100

Handling Company
Photoscience Co., Ltd.

Categories

Observation Equipment

Industrial Microscopes

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1 Models of SiC microscopic observation device SCM-100

Image	Part Number	Price (excluding tax)	Sample cooling device (optional)	Observation magnification	DC stabilized power supply	Movable stage	Control and data processing	Logging function	Lens	Sequence creation	Camera	XY movable distance	Option
	SCM-100	Available upon quote	Cooling water circulation system EYELA CCA-1112 Peltier temperature controller VTH-3500	Variable from about 60 to about 200 times on 16 inch LCD	Texio PSW360L30Y1 Maximum voltage 30V, maximum current 36A (30V/12A-10V/36A)	40X40mm	PC (with LAN, USB terminal) /OS: Windows®7/8	Saves output voltage, output current, and status information in memory	Canon zoom lens EF-S55-250mm F4-5.6 IS II	CSV method, read with USB memory	PENTAX Q-S1 equivalent (interval shooting possible, C mount, AC cable included)	±6.5mm	Cooling water circulation system CCA-1112

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About Company Handling This Product

Photoscience Co., Ltd.

Response Rate

100.0%

Response Time

2.2hrs

Japan

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SiC microscopic observation device SCM-100 Photoscience Co., Ltd.

Photoscience Co., Ltd.'s Response Status

About This Product

■Summary

■Features

■Applications

■Product usage examples

1 Models of SiC microscopic observation device SCM-100

SCM-100

Customers who viewed this product also viewed

Other products of Photoscience Co., Ltd.

About Company Handling This Product

Related search keywords

SiC microscopic observation device SCM-100
Photoscience Co., Ltd.