AFM Jupiter XR Atomic Force Microscope (AFM/SPM) with excellent basic performance
Oxford Instruments Ltd.
About This Product
■Summary
Jupiter XR is an atomic force microscope (AFM/SPM) that can handle large samples, and is an AFM with excellent basic performance that combines "ultra-high resolution" at the atomic and molecular level as well as "high-speed scanning" and "wide-area scanning". . In addition to the innovative and robust latest design, the unique blue Drive photothermal excitation tapping enables stable and highly reproducible measurements, enabling continuous measurement of 1000 sheets for 15 hours in nano-roughness measurement.
■Features
・Latest design and technology that surpasses conventional stage-type AFM
・Stable and highly reproducible measurements with blue Drive tapping and robust design
・Achieve ultra-high resolution, high-speed scanning, and wide-area scanning with a single scanner (no need to replace the scanner)
・Spatial resolution at atomic/molecular level
・High-speed scanning at a maximum speed of several tens of Hz
・Wide scan range (100µm)
・Special optical microscope design and new software “Ergo” with excellent operability
AFM equipped with a "large sample motor stage" based on the concept of "Cypher" and following the diversity and expandability of "MFP-3D
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Product
AFM Jupiter XR Atomic Force Microscope (AFM/SPM) with excellent basic performance
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Handling Company
Oxford Instruments Ltd.
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Categories
1 Models of AFM Jupiter XR Atomic Force Microscope (AFM/SPM) with excellent basic performance
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Jupiter XR Atomic Force Microscope (AFM/SPM) |
Available upon quote |
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About Company Handling This Product
- Japan