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  4. Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope (Oxford Instruments Ltd.)
Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope-Alpha300A–AFM
Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope-Oxford Instruments Ltd.

Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope
Oxford Instruments Ltd.

Oxford Instruments Ltd.'s Response Status

Response Rate

100.0%

Response Time

26.3hours

Relatively Fast Response

About This Product

■Nanoscale surface observation

WITec's alpha300A atomic force microscope is a reliable, high-quality nanoscale imaging system integrated into a research-grade optical microscope with a wide range of options for high-resolution sample localization and cantilever imaging. positioning is possible. WITec's atomic force microscopes are designed to be used in combination with other imaging capabilities, such as Raman imaging. All imaging techniques can be incorporated into the same microscope system. You can switch between modes by rotating the microscope's revolver and switching the objective lens. Functions that can be combined with AFM include luminescence, fluorescence, polarization imaging, brightfield, darkfield, SNOM, and Raman imaging.

■Features

・Surface observation at nanometer scale ・Lateral resolution:<1nm ・Depth resolution:<0.3nm ・Supports a wide range of AFM operating modes ・Easy sample access from any direction ・Observation in air and liquid ・Unique cantilever mounting method that makes cantilever replacement and alignment easy ・Accurate scanning stage control with TrueScan™ mode ・Stage type: 30x30x20µm³; 100x100x20µm³; 200x200x20µm³ ・Non-destructive observation with no sample processing required ・Raman imaging, upgradeable to SNOM

■Operating mode

・Contact mode ・AC mode (tapping mode) ・Digital pulse force mode (DPFM) ・Lift Mode™ ・Magnetic force microscope (MFM) ・Electrostatic force microscope (EFM) ・Phase image ・Force curve ・Nanomanipulation/lithography ・Friction force microscope (LFM) ・Chemical force microscopy (CFM) ·others

■Microscope

・Research grade optical microscope with 6-objective lens revolver ・Video system: Eyepiece color video camera ・White LED Keller lighting ・XY direction manual sample stage X,Y25mm ・Active vibration isolation table included ・Piezo scanning stage (scanning width 100x100x20μm) (options for other scanning widths available)

■Cantilever accessories

・AC mode, back reflective coating ・Ring premount ・Contact mode ・Rear reflective coating ・Ring premount Can use most commercially available cantilevers

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    Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope

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1 Models of Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope

Image Part Number Price (excluding tax) Sample size Computer, software AFM cantilever
Specifying the sample observation location and positioning the cantilever is possible alpha300A–AFM atomic force microscope-Part Number-Alpha300A–AFM

Alpha300A–AFM

Available upon quote

Length and width: 120mm, thickness: 25mm, thicker samples can be accommodated with an adapter

Equipment control, data collection software, data analysis evaluation software

Inertial drive type AFM cantilever position adjustment mechanism
Can use most commercially available cantilevers

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About Company Handling This Product

Oxford Instruments Ltd.

Response Rate

100.0%

Response Time

26.3hrs

  • Japan

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Atomic Force Microscopes
Atomic Force Microscopes　Oxford Instruments Ltd.
Oxford Instruments Ltd.

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