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Micro defect inspection device that automatically saves inspection data and images-Micro defect inspection equipment
Micro defect inspection device that automatically saves inspection data and images-CHUO ELECTRIC WORKS L.T.D

Micro defect inspection device that automatically saves inspection data and images
CHUO ELECTRIC WORKS L.T.D

CHUO ELECTRIC WORKS L.T.D's Response Status

Response Rate

100.0%

Response Time

21.4hours

Relatively Fast Response


About This Product

This is a two-dimensional inspection device that uses a high-resolution camera and a high-precision X-Y stage. Suitable for inspecting surface scratches, foreign objects, and defects on optical films, sheets, touch panels, etc. With an optical resolution of 1.8μm, extremely high-definition inspection is possible. It can also handle dimension measurements and inspect two-dimensional punched products.

■Features

・Automatically save inspection data and images ・Camera pixel count: 9 million pixels ・High optical resolution (1.8μm) allows you to see fine inspection points clearly ・Ideal for inspecting peripheral electrodes of touch panels and fine wiring on printed circuit boards for disconnections and short circuits.

■Applications

・For inspecting defects such as touch panels, foreign objects, etc. ・Touch panel peripheral electrode defect inspection ・Inspection of sheet surface scratches and foreign objects ・Board defect inspection

  • Product

    Micro defect inspection device that automatically saves inspection data and images

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1 Models of Micro defect inspection device that automatically saves inspection data and images

Image Part Number Price (excluding tax) weight Measurement range Maximum height of measurements Optical decomposition ability Control decomposition ability Visible range monitor camera lens illumination power supply development language Camera Monitor Lens Optical magnification Optical resolution Control resolution External dimensions Measuring range Illumination Repeated positioning accuracy Maximum height of measured object Field of view Weight Development language Power supply
Micro defect inspection device that automatically saves inspection data and images-Part Number-Micro defect inspection equipment

Micro defect inspection equipment

Available upon quote

400kg

600 x 400mm

30mm

1.8μm

1.0μm

6.3mm x 5.0mm

TFT23.6 type wide resolution: 1,920 x 1,080 pixels

CCD monochrome 1 inch pixels: 9 million pixels

Telecent trick lens WD: 65mm depth of field: 0.095mm

Coaxial fire radiation

AC100V 50/60Hz

LabView

CCD monochrome 1 inch Pixel count: 9 million pixels

TFT23.6 wide resolution: 1,920 x 1,080 pixels

Telecentric lens WD: 65mm Depth of field: 0.095mm

2x

1.8μm

1.0μm

1,000×1,200×1,080mm

600×400mm

Coaxial epi-illumination

±5μm

30mm

6.3mm×5.0mm

400kg

LabVIEW

AC100V 50/60Hz

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About Company Handling This Product

Response Rate

100.0%


Response Time

21.4hrs

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