Micro defect inspection device that automatically saves inspection data and images-Micro defect inspection equipment
Micro defect inspection device that automatically saves inspection data and images-CHUO ELECTRIC WORKS L.T.D

Micro defect inspection device that automatically saves inspection data and images
CHUO ELECTRIC WORKS L.T.D


About This Product

This is a two-dimensional inspection device that uses a high-resolution camera and a high-precision X-Y stage. Suitable for inspecting surface scratches, foreign objects, and defects on optical films, sheets, touch panels, etc. With an optical resolution of 1.8μm, extremely high-definition inspection is possible. It can also handle dimension measurements and inspect two-dimensional punched products. ■Features ・Automatically save inspection data and images ・Camera pixel count: 9 million pixels ・High optical resolution (1.8μm) allows you to see fine inspection points clearly ・Ideal for inspecting peripheral electrodes of touch panels and fine wiring on printed circuit boards for disconnections and short circuits. ■Applications ・For inspecting defects such as touch panels, foreign objects, etc. ・Touch panel peripheral electrode defect inspection ・Inspection of sheet surface scratches and foreign objects ・Board defect inspection

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    Micro defect inspection device that automatically saves inspection data and images

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1 Models of Micro defect inspection device that automatically saves inspection data and images

Product Image Part Number Price (excluding tax) Camera Control decomposition ability Control resolution Development language External dimensions Field of view Illumination Lens Maximum height of measured object Maximum height of measurements Measurement range Measuring range Monitor Optical decomposition ability Optical magnification Optical resolution Power supply Repeated positioning accuracy Visible range Weight camera development language illumination lens monitor power supply weight
Micro defect inspection device that automatically saves inspection data and images-Part Number-Micro defect inspection equipment

Micro defect inspection equipment

Available upon quote CCD monochrome 1 inch Pixel count: 9 million pixels 1.0μm 1.0μm LabVIEW 1,000×1,200×1,080mm 6.3mm×5.0mm Coaxial epi-illumination Telecentric lens WD: 65mm Depth of field: 0.095mm 30mm 30mm 600 x 400mm 600×400mm TFT23.6 wide resolution: 1,920 x 1,080 pixels 1.8μm 2x 1.8μm AC100V 50/60Hz ±5μm 6.3mm x 5.0mm 400kg CCD monochrome 1 inch pixels: 9 million pixels LabView Coaxial fire radiation Telecent trick lens WD: 65mm depth of field: 0.095mm TFT23.6 type wide resolution: 1,920 x 1,080 pixels AC100V 50/60Hz 400kg

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