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Measurement of film thickness on metal and non -metal elements Ultrasonic membrane thick meter Quint Sonic 7Handling Company
SANKO ELECTRONIC LABORATORY CO.,LTDCategories
| Image | Part Number | Price (excluding tax) | Number of batches | Stantable temperature | Measurement accuracy (measurement vertically against smooth surface) | Minimal resolution | Minimum measurement area | LCD display | Heavy body | Operating temperature | calibration | Heavy sensor | Aircraft size body | Conformity standard | Data output | Additional function | Measurement layer | Minimum measurement membrane thickness | Statistical display function | Measurement range 3 | Measurement range 4 | Measurement range 1 | Measurement range 5 | Measurement range 2 | power supply | Measurement method | Sensor contact area | The minimum measurement bent convex surface | Measured value memory | Aircraft size sensor |
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Quint Sonic 7 |
Available upon quote |
300 |
-10 ~+50 ℃ |
± (1 μm+1%of the reading value) |
0.1μm |
11mm |
160 x 160 pixels, with backlight |
310g |
5 to 50 ° C (not condensation) |
Calibration for 5 layers up to 5 layers |
80g |
89 (W) x 153 (H) x 32 (d) mm |
Din En ISO 2808, JIS K 5600-1-7 |
IRDA1.0 (Options: USB, RS-232) |
Memory function, statistical operation function |
Up to 5 layers at once |
Approximately 10 μm (depending on the sound speed) |
Number of measurements, minimum, maximum, average, standard deviation, fluctuation coefficient, block statistics, histogram, trend diagram |
Measurement range: 1,900 μm, decomposition ability: 1 μm, accuracy: 1 μm |
Measurement range: 3,900 μm, decomposition ability: 2 μm, accuracy: 2 μm |
Measurement range: 356 μm, decomposition ability: 0.25 μm, accuracy: 0.25 μm |
Measurement range: 7,500 μm, decomposition ability: 4 μm, accuracy: 4 μm |
Measurement range: 890 μm, resolution ability: 0.5 μm, accuracy: 0.5 μm |
AA batteries x 4 |
Ultrasonic echo reflection method |
Diameter 11mm |
Diameter 50mm |
Approximately 250,000 points (total) |
φ25 x 60mm |
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Reviews shown here are reviews of companies.
