Product
NEO Series exclusive probe option electromagnetic type vortex-type dual sfn-325Handling Company
SANKO ELECTRONIC LABORATORY CO.,LTDProduct Image | Part Number | Price (excluding tax) | Connecting device | Discrimination of material | Display resolution ability | Measurement accuracy (measurement vertically against smooth surface) | Measurement method | Measurement range | accessories | option | probe |
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SFN-325 |
Available upon quote | SWT-NEO series (NEO, NEO II, NEO II) | Automatic and manual switching | 1 μm: 0 to 999 μm, 0.1 μm: 0 to 400 μm, 0.5 μm: 400 ~ 500 μm, 0.01mm: (iron elements: 1.00 to 3.00 mm) (non -iron ranges: 1.00 to 2.50 mm) | 0 ~ 100 μm: ± 1 μm, or within ± 2%of the instruction values, iron ranges: 101 μm ~ 3.00 mm: within ± 2%, non -trails: 101 μm to 2.50 mm: within ± 2%. | Electromagnetic type / whirlpool -type bilateral (automatic base discrimination) | Iron ranges: 0 to 3.00mm, non -ferrous metal elements: 0 to 2.50mm | Standard thick plate, zero plate for testing (for iron, non -iron) | V -type probe adapter | 1 point pressure contact type, V -cut, φ15 x 50.9mm, 72g |
SANKO ELECTRONIC LABORATORY CO.,LTD