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NEO Series exclusive probe option electromagnetic type vortex-type dual sfn-325Handling Company
SANKO ELECTRONIC LABORATORY CO.,LTDCategories
| Image | Part Number | Price (excluding tax) | Measurement accuracy (measurement vertically against smooth surface) | probe | Display resolution ability | Connecting device | option | Discrimination of material | Measurement range | Measurement method | accessories |
|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
SFN-325 |
Available upon quote |
0 ~ 100 μm: ± 1 μm, or within ± 2%of the instruction values, iron ranges: 101 μm ~ 3.00 mm: within ± 2%, non -trails: 101 μm to 2.50 mm: within ± 2%. |
1 point pressure contact type, V -cut, φ15 x 50.9mm, 72g |
1 μm: 0 to 999 μm, 0.1 μm: 0 to 400 μm, 0.5 μm: 400 ~ 500 μm, 0.01mm: (iron elements: 1.00 to 3.00 mm) (non -iron ranges: 1.00 to 2.50 mm) |
SWT-NEO series (NEO, NEO II, NEO II) |
V -type probe adapter |
Automatic and manual switching |
Iron ranges: 0 to 3.00mm, non -ferrous metal elements: 0 to 2.50mm |
Electromagnetic type / whirlpool -type bilateral (automatic base discrimination) |
Standard thick plate, zero plate for testing (for iron, non -iron) |
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Reviews shown here are reviews of companies.
