Reflectance measurement device MSP-100-MSP-100

Reflectance measurement device MSP-100
Shibuya Optical Co., Ltd.

About This Product

■High-speed, high-precision measurement of micro areas, curved surfaces, and ultra-thin samples at an unprecedentedly low cost・Using a special half mirror (patented), it cuts back-reflected light and allows for quick and accurate measurements without back-side treatment. (Reflectance measurement of thin plate 0.2mm possible: When using ×20 objective lens)
- Lens curved surfaces and coating unevenness can also be measured. (Connect a minute spot (φ50μm) on the sample surface)
・Even low-reflection samples can be measured in a short time with high reproducibility. (The unique optical design captures the maximum amount of light, and realizes speedy measurements with a 512-element linear PDA, built-in 16-bit A/D converter, and USB 2.0 interface high-speed calculation)
・Can perform chromaticity measurement and L*a*b* measurement. Objects can be measured based on spectral reflectance using spectral colorimetry.
- Data can be saved in Microsoft Excel (R) format.
・Single layer films can be measured non-contact and non-destructively.
- Equipped with a function to display multiple measurement results on the same screen. This makes it easier to compare measurement results.

Model
There is 1 model available for this product.

Product
Reflectance measurement device MSP-100

Handling Company
Shibuya Optical Co., Ltd.

Categories

Meters & Instruments

Reflectometers

20+ people viewing

Last viewed: 1 hour ago

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1 Models of Reflectance measurement device MSP-100

Image	Part Number	Price (excluding tax)	Operating temperature range	Operating humidity	External dimensions	Measurement reproducibility	Measurement time	Measurement wavelength	Display resolution	Sample radius of curvature	Sample measurement range	Sample side N.A.
	MSP-100	Available upon quote	18~28℃	60% or less (no condensation)	(W) 230× (H) 560× (D) 460mm (body only)	±0.2% (380~450nm) ±0.02% (451~950nm) ±0.2% (951~1,050nm)	Several seconds to tens of seconds (depending on sampling time)	380~1,050nm	1nm	-1R~-∞, +1R~∞	Φ50μm (when using 10x objective lens)	N.A. 0.12 (when using 10x objective lens)

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