Multi-layer photo register processed fine patterns (pattern width 3μ) on the image inspection Fine pattern inspection device SFVC-260MP
Shin -Electronic Co., Ltd.

About This Product

Examine the image of a microscopic pattern (pattern width of 3μ) that has been processed on a multilayer photo register on the glass.

Model
There are 1 models for this product.

Product
Multi-layer photo register processed fine patterns (pattern width 3μ) on the image inspection Fine pattern inspection device SFVC-260MP

Handling Company
Shin -Electronic Co., Ltd.

*Please note that we may not be able to accommodate sample requests.

1 Models of Multi-layer photo register processed fine patterns (pattern width 3μ) on the image inspection Fine pattern inspection device SFVC-260MP

Product Image	Part Number	Price (excluding tax)
	SFVC-260MP	Available upon quote

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