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Multi-layer photo register processed fine patterns (pattern width 3μ) on the image inspection Fine pattern inspection device SFVC-260MP
Shin -Electronic Co., Ltd.

Shin -Electronic Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

27.6hours

Relatively Fast Response


About This Product

Examine the image of a microscopic pattern (pattern width of 3μ) that has been processed on a multilayer photo register on the glass.

  • Product

    Multi-layer photo register processed fine patterns (pattern width 3μ) on the image inspection Fine pattern inspection device SFVC-260MP

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1 Models of Multi-layer photo register processed fine patterns (pattern width 3μ) on the image inspection Fine pattern inspection device SFVC-260MP

Image Part Number Price (excluding tax)

SFVC-260MP

Available upon quote

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About Company Handling This Product

Response Rate

100.0%


Response Time

27.6hrs

  • Japan

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