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  4. Industrial microscope MX63 (Ryokosha Co., Ltd.)
Industrial microscope MX63-MX63
Industrial microscope MX63-Ryokosha Co., Ltd.

Industrial microscope MX63
Ryokosha Co., Ltd.

Ryokosha Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

31.3hours

Relatively Fast Response

About This Product

■Summary

Make inspection of semiconductors, FPDs, etc. more comfortable and efficient. MX63/MX63L is a large microscope that can inspect samples such as wafers, liquid crystal panels, and electronic boards up to 300 mm in size. By combining modules that support various applications, we can provide a system that is beneficial to our customers.

■Features

・High-brightness white LED lighting with stable color temperature characteristics High-brightness white LED light source allows epi-illumination and transmitted-light observation. With LED lighting, the color of the image does not change even if you change the brightness during observation, so you can always obtain clear images. In addition, LEDs generate less heat and have a long lifespan, which reduces costs and reduces the hassle of replacing lamps. The color does not change depending on the brightness and can be observed with clearer color than a halogen lamp. ・See what you couldn't see: MIX observation By combining bright field, simple polarized light, fluorescence, etc. with dark field illumination methods, you can achieve unprecedented visibility. In addition, darkfield illumination can be illuminated from any four directions, making it possible to more effectively highlight objects within the inspection sample. ・Applications: Using a variety of conventional microscope observation methods, we can accommodate a variety of customer samples and inspection purposes. Furthermore, new observation methods such as MIX observation and observation with simultaneous epi-illumination and transmitted illumination can be used, allowing you to obtain images more suited to your purpose. ・Film material (bright field observation / polarized light observation) This is an observation method that visualizes three-dimensionally by adding contrast to minute steps at the several nanometer level that cannot be seen with bright field observation. Three types of differential interference prisms are available to obtain the appropriate resolution and contrast depending on the characteristics of the sample. Suitable for inspecting foreign objects and scratches on hard disk surfaces and wafer polished surfaces. ・Hard disk (bright field observation/differential interference observation) This is an observation method that visualizes three-dimensionally by adding contrast to minute steps of several nanometers that cannot be seen with bright field observation. Three types of differential interference prisms are available to obtain the appropriate resolution and contrast depending on the characteristics of the sample. Suitable for inspecting foreign objects and scratches on hard disk surfaces and wafer polished surfaces.

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    Industrial microscope MX63

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1 Models of Industrial microscope MX63

Image Part Number Price (excluding tax)
Industrial microscope MX63-Part Number-MX63

MX63

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About Company Handling This Product

Ryokosha Co., Ltd.

Response Rate

100.0%

Response Time

31.3hrs

Related search keywords

Industrial Microscopes
Industrial Microscopes　Ryokosha Co., Ltd.
Ryokosha Co., Ltd.

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