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Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-SCM5100
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-SCM5100-50
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-SCM5130
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-SCM5200
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-SCM5200-50
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-SCM5400
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-SCM5H00
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-PBI Advanced Materials Co., Ltd.

Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series
PBI Advanced Materials Co., Ltd.


About This Product

PEEK (polyethel ether ketone) has a high heat -resistant temperature as a thermoplastic resin, has a continuous use temperature of 260 ° C, and the enhanced grade with carbon fiber and glass fiber indicates the loaded wet temperature of 300 ° C or more. It is used for semiconductor carriers and seal rings for automobiles, which require heat resistance and emphasize wear resistance. The chemical resistance is excellent for fluorine -based resin, and because it is more rugged than fluorine resin, it requires chemical resistance and requires hardness, and because it has good water resistance. It is used for piping parts of houses. We use PEEK by compressed molding method, and we also produce large -sized mass -processing base materials of φ300 or more.

■ PEEK feature

・ Base resin: PEEK ・ High heat resistance

  • Product

    Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series

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10 Models of Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series

Click on the part number for more information about each product

Image Part Number Price (excluding tax) Glass transfer temperature (TG) Tensile strength Tenstration destroyed strain Bending strength Bending elasticity rate Notch with a notch with a shock strength Line expansion rate Surface resistance value Water absorption rate Hammer material size shape Maternal material size angle (mm) Homber size thickness (mm) Mother material size MOQ/SPQ
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SCM5100

SCM5100

Available upon quote

~ 140 ° C (standard: DSC)

80MPa (Condition: 23 ° C, Standard: ISO 527)

1.0% (Condition: 23 ° C, Standards: ISO 527)

100MPa (Condition: 23 ° C, Standard: ISO 178)

8.0GPa (Condition: 23 ° C, Standard: ISO 178)

1.2kj/m^2 (Condition: 23 ° C, Standard: ISO 179)

38ppm/℃ (Condition:

10^9 --10^12Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

0.09% (Condition: 23 ° C, 24hr, Standard: ISO 62)

Plate

305

5,10,15

1/1

Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SCM5100-50

SCM5100-50

Available upon quote

~ 140 ° C (standard: DSC)

90MPa (Condition: 23 ° C, Standard: ISO 527)

1.0% (Condition: 23 ° C, Standards: ISO 527)

150MPa (Condition: 23 ° C, Standard: ISO 178)

15GPa (Condition: 23 ° C, Standard: ISO 178)

1.5kj/m^2 (Condition: 23 ° C, Standard: ISO 179)

26ppm/℃ (Condition:

10^9 --10^12Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

0.10% (Condition: 23 ° C, 24hr, Standard: ISO 62)

- - - -
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SCM5130

SCM5130

Available upon quote

~ 140 ° C (standard: DSC)

90MPa (Condition: 23 ° C, Standard: ISO 527)

1.5% (Condition: 23 ° C, Standard: ISO 527)

130MPa (Condition: 23 ° C, Standard: ISO 178)

8.0GPa (Condition: 23 ° C, Standard: ISO 178)

1.5kj/m^2 (Condition: 23 ° C, Standard: ISO 179)

38ppm/℃ (Condition:

10^6 --10^10Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

-

Plate

305

5,10,15

1/1

Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SCM5200

SCM5200

Available upon quote

~ 140 ° C (standard: DSC)

80MPa (Condition: 23 ° C, Standard: ISO 527)

1.2% (Conditions: 23 ° C, Standards: ISO 527)

120MPa (Condition: 23 ° C, Standard: ISO 178)

9.5GPa (Condition: 23 ° C, Standard: ISO 178)

1.2kj/m^2 (Condition: 23 ° C, Standard: ISO 179)

33ppm/℃ (Condition:

> 10^13Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

0.09% (Condition: 23 ° C, 24hr, Standard: ISO 62)

- - - -
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SCM5200-50

SCM5200-50

Available upon quote

~ 140 ° C (standard: DSC)

80MPa (Condition: 23 ° C, Standard: ISO 527)

0.8% (Condition: 23 ° C, Standard: ISO 527)

120MPa (Condition: 23 ° C, Standard: ISO 178)

13GPa (Condition: 23 ° C, Standard: ISO 178)

1.8kj/m^2 (Conditions: 23 ° C, Standard: ISO 179)

25 ppm/℃ (Condition:

> 10^13Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

0.1% (Conditions: 23 ° C, 24hr, Standard: ISO 62)

Plate

305

5,10,15,20,30,40

1/1

Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SCM5400

SCM5400

Available upon quote

~ 140 ° C (standard: DSC)

90MPa (Condition: 23 ° C, Standard: ISO 527)

2.0% (Condition: 23 ° C, Standard: ISO 527)

160MPa (Condition: 23 ° C, Standard: ISO 178)

4.5GPa (Condition: 23 ° C, Standard: ISO 178)

2.5kj/m^2 (Condition: 23 ° C, Standard: ISO 179)

-

10^4–10^9Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

0.06% (Condition: 23 ° C, 24hr, Standard: ISO 62)

Plate

300

5,10,15,20,30,40

1/1

Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SCM5H00

SCM5H00

Available upon quote

~ 140 ° C (standard: DSC)

40MPa (Condition: 23 ° C, Standard: ISO 527)

0.3% (Condition: 23 ° C, Standard: ISO 527)

65MPa (Condition: 23 ° C, Standard: ISO 178)

17GPa (Condition: 23 ° C, Standard: ISO 178)

1.0kj/m^2 (Condition: 23 ° C, Standard: ISO 179)

-

> 10^13Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

0.02% (Condition: 23 ° C, 24hr, Standard: ISO 62)

- - - -
Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SPR5200BK

SPR5200BK

Available upon quote

~ 140 ° C (standard: DSC)

110MPa (Condition: 23 ° C, Standard: ISO 527)

2.5% (Condition: 23 ° C, Standard: ISO 527)

200MPa (Condition: 23 ° C, Standard: ISO 178)

8.0GPa (Condition: 23 ° C, Standard: ISO 178)

4.4kj/m^2 (Condition: 23 ° C, Standard: ISO 179)

29ppm/℃ (Condition:

> 10^13Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

0.04% (Condition: 23 ° C, 24hr, Standard: ISO 62)

Plate

204 x 305

4,6,10

1/1

Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-SPR5250

SPR5250

Available upon quote

~ 140 ° C (standard: DSC)

120MPa (Condition: 23 ° C, Standard: ISO 527)

2.0% (Condition: 23 ° C, Standard: ISO 527)

230MPa (Condition: 23 ° C, Standard: ISO 178)

11GPa (Condition: 23 ° C, Standard: ISO 178)

3.8kj/m^2 (Condition: 23 ° C, Standard: ISO 179)

- - -

Plate

204 x 305

Ten

1/1

Used for semiconductor test sockets, etc. | PEEK (Polyethel ether keton) 5000 series-Part Number-Color Plate

Color Plate

Available upon quote

~ 140 ° C (standard: DSC)

100MPa (Condition: 23 ° C, Standard: ISO 527)

45% (Conditions: 23 ° C, Standards: ISO 527)

165MPa (Condition: 23 ° C, Standard: ISO 178)

4.1GPa (Condition: 23 ° C, Standard: ISO 178)

7.0kj/m^2 (Conditions: 23 ° C, Standard: ISO 179)

55pm/℃ (Condition:

> 10^13Ω (Condition: 23 ° C, Standard: ANSI/ESD STM11.13)

0.07% (Condition: 23 ° C, 24hr, Standard: ISO 62)

- - - -

Click on the part number for more information about each product

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