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  3. Stress Analyzers
  4. Near-infrared photoelastic stress measurement NIR-GFP (Laser Measurement Co., Ltd.)
Near-infrared photoelastic stress measurement NIR-GFP-NIR-GFP
Near-infrared photoelastic stress measurement NIR-GFP-Laser Measurement Co., Ltd.

Near-infrared photoelastic stress measurement NIR-GFP
Laser Measurement Co., Ltd.

Laser Measurement Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

7.2hours

Fast Response

About This Product

■Summary

NIR-GFP is a system that uses infrared light as a light source to automatically measure the distribution of residual stress in silicon and other semiconductor chips and wafers, which has been difficult to measure with conventional photoresistance systems that use visible light as a light source.

  • Product

    Near-infrared photoelastic stress measurement NIR-GFP

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1 Models of Near-infrared photoelastic stress measurement NIR-GFP

Image Part Number Price (excluding tax) Repeatability Accuracy Focal length Measuring range Resolution Frame rate Camera interface
Near-infrared photoelastic stress measurement NIR-GFP-Part Number-NIR-GFP

NIR-GFP

Available upon quote

2%

0-10nm ±0.5nm
0-100nm ±0.5nm
100-range ±5%

20mm, 30mm fixed

1/2λ

Camera dependent

10f/s

GigE

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About Company Handling This Product

Laser Measurement Co., Ltd.

Response Rate

100.0%

Response Time

7.2hrs

  • Japan

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