LAUE measuring device-LAUE measuring device

LAUE measuring device
Lucille Co., Ltd.

About This Product

■Features- Available in vertical, horizontal and granular map configurations
Plug-and-play compact cabinet system - no customized benches or additional services required
- Fully automated motorized XYZ stage and goniometer, manual option also available
・CCD back reflection type, high resolution, high sensitivity X-ray detector
・Small collimated beam size realized by unique condensing optical system
・Quick and accurate alignment of small crystals with onboard high-resolution observation camera
Distance measurement tool for accurate and reproducible sample positioning
Dedicated Laue software for complete control, data collection, processing and analysis
・High-throughput sample screening options

■Vertical configurationThe most flexible configuration, the vertical LAUE system, uses a vertical beam path to scan multiple isolated crystals or multiple regions of interest at high throughput. Utilizing gravity eliminates the need to stick the sample to the platform, making it easier to attach and orient the crystal. The <200µm beam size accommodates both sub-millimeter range samples and large components such as turbine alloys.

■Horizontal compositionCan also be used with traditional horizontal geometry. The horizontal LAUE system is suitable for orienting the crystal to cut or quickly scanning the crystal to identify reflections.

■Grain map compositionA vertical system with special cameras, lenses, lighting, and mapping software to measure the orientation of each grain. Grain Map includes a fully motorized XYZ stage and goniometer as standard, making it ideal for grain mapping on silicon wafers.

Model
There are 1 models for this product.

Product
LAUE measuring device

Handling Company
Lucille Co., Ltd.

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1 Models of LAUE measuring device

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	LAUE measuring device	Available upon quote

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About Company Handling This Product

Lucille Co., Ltd.

Japan

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LAUE measuring device Lucille Co., Ltd.

About This Product

■Features

■Vertical configuration

■Horizontal composition

■Grain map composition

1 Models of LAUE measuring device