This product is registered by Oki Riko Jizai Co., Ltd..
About This Product
MiniFlex Overview
■Effects of orientation and coarse grains are obvious at a glance
In combination with the two-dimensional detector HyPix-400 MF, the orientation of the sample and the effects of coarse grains can be seen at a glance. Even if the particles are coarse, it is possible to obtain a powder X-ray diffraction profile that is close to the database intensity ratio based on 2D measurement data.
■Safety design (no need to appoint an X-ray work supervisor (Japan))
Adopts a completely sealed cabinet structure. The interlock mechanism prevents the sample chamber door from being opened while X-rays are being irradiated. There is no need to appoint an X-ray work supervisor (Japan), making equipment safety management easy.
■High resolution
It is also useful for profile analysis such as the Rietveld method and measurement of organic substances where complex peaks are observed. The high output of 600W greatly reduces measurement time for high-resolution measurements. If you use an automatic sample exchange device, it can be operated unattended for long periods of time.
■High angle accuracy
High-precision mechanical link axes with equidistant control and real-time angle correction ensure the best angular accuracy at all times.
■High PB ratio
Hybrid entrance slit (Hybrid entrance slit: continuously variable slit + fixed slit machine) and scattering protector (patent pending) enable high PB ratio and blind-free measurement from low angle to high angle range.
■A wide variety of attachments
・8 sample automatic exchange device
・Temperature variable attachment
・Light receiving monochromator
・Rotating sample stage
・General-purpose atmosphere separator
■Application example
・Quantitative analysis of asbestos and free silicic acid
・Quality control of pharmaceuticals and industrial raw materials
・Pattern measurement of crystals, amorphous, and crystalline polymorphs
・High school/technical college/university education, student experiments, etc.
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