Optical microscope elemental analysis system DM6 M LIBS
Oki Riko Jizai Co., Ltd.
About This Product
■Summary
Two systems for observation and chemical analysis are integrated into one system, allowing elemental analysis without pretreatment. The chemical composition of the fine structure being observed can be quickly identified using the laser plasma spectroscopy function. Once you have found your measurement location, you can start LIBS analysis with one click.
Features
■Laser-induced breakdown spectroscopy (LIBS)
Analysis begins with a single click and a pulsed laser is fired onto the sample surface. A small amount of sample on the ablated surface becomes a high-energy plasma with free electrons and excited atoms. During the cooling process, atoms and excited electrons return to the ground state, emitting radiation at specific peaks. The synchrotron radiation from this plasma is collected in a spectrometer and by identifying each peak, the chemical composition can be determined quickly. Spectra are matched using software (libraries) to identify microstructural components. The data can be expanded by adding results for specific materials obtained by the user.
others
■Optical microscope elemental analysis system [A new option for detecting minute metal foreign objects]
To understand the amount and composition of mixed foreign substances, there are various analyzes such as ICP emission spectroscopy, energy dispersive X-ray spectroscopy, and X-ray fluorescence spectroscopy, but each method has its own problems. Examples include the inability to determine the number and size of foreign objects, the inability to detect light elements such as lithium and sodium, the inability to detect foreign objects inside the sample, or the time it takes.
The Leica DM6 M LIBS can perform elemental analysis of battery materials such as separators and anode materials without any pretreatment, and can also output the number, size, composition, and microscopic images of metal foreign particles in a few seconds. The operation method is the same as that of a microscope, and a single device can handle a series of workflows from visual inspection to chemical analysis. This is a new analytical method that can detect minute metal foreign particles that can reduce battery capacity, shorten battery life, and even cause fire.
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Product
Optical microscope elemental analysis system DM6 M LIBS
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Handling Company
Oki Riko Jizai Co., Ltd.
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Categories
1 Models of Optical microscope elemental analysis system DM6 M LIBS
| Product Image | Part Number | Price (excluding tax) |
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DM6 M LIBS |
Available upon quote |
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About Company Handling This Product
- Japan