Particle counter surface contamination measuring instrument QIII
MCC Co., Ltd.
About This Product
QIII measures particles on surfaces in just seconds
■Features
・Detects particles of 0.3μm or larger (QIIIUItra) 0.1μm or larger in a few seconds (QIIIMax)
・Easily measure difficult areas with a variety of probe shapes
■Ideal for these people
・After cleaning the components used in various manufacturing equipment in the clean room, check the degree of cleaning.
・Conventional methods of checking cleanliness take too much time
・I want to check areas where it is difficult to check the degree of cleanliness using conventional methods.
・Want to quantitatively define cleaning procedures and standards
・Troubleshooting such as identifying the source of dust
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Product
Particle counter surface contamination measuring instrument QIII
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Handling Company
MCC Co., Ltd.
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Categories
1 Models of Particle counter surface contamination measuring instrument QIII
| Product Image | Part Number | Price (excluding tax) | Display | GUI | Input power | Output | Particle size display (μm) | Probe faceplate | Sensor | Size | Weight |
|---|---|---|---|---|---|---|---|---|---|---|---|
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QIIIMax |
Available upon quote | 7 inch WVGA (touch panel type) | Windows CE | 100~240VAC 50/60Hz | USB | 6 channels 0.3/0.5/1.0/3.0/5.0/10.0 | Vespel | Optical spawning method (0.3μm~) Semiconductor laser specifications | Approximately 360×340×230mm | Approximately 8.6kg |
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About Company Handling This Product
- Japan