Spectrophotometer LINZA150 series spectrophotometer for optical lens evaluation and quality control
Tokyo Instruments, Inc
About This Product
■Spectrophotometer LINZA150 series for optical lens evaluation and quality control
・MWIR 2.7～5.2μm LINZA2752 new product released
・Fully automatic and highly accurate measurement of transmittance and reflectance spectral characteristics of single lenses and lens assemblies
■Spectrophotometer for optical lens evaluation and quality control LINZA150 Overview
"LINZA150" manufactured by ESSENT Optics is ideal for evaluating and quality control of optical lenses that can fully automatically measure the reflectance and transmittance of single lenses such as convex lenses, concave lenses, and cylindrical lenses, as well as the transmittance of lens assemblies such as camera lenses. It is a spectrophotometer.
In particular, when measuring the reflectance of a single lens, it is equipped with an automatic angle setting function (maximum lens tilt angle of 55°) when measuring off-axis reflections other than the optical axis center of the lens, making it much more effective than conventional spectroscopic altimeters. Work efficiency is increased and takt time can be significantly reduced.
For transmittance measurements, lens assemblies such as camera lenses can also be placed on the measurement table for easy measurement. This device is recommended for use by manufacturers who routinely evaluate the film formation of optical lenses and control the quality of finished products.
Compatible with a wide wavelength range of 185 to 1,700 nm (fully automatic detector switching), off-axis reflectance measurement function (automatic angle adjustment), and equipped with a mercury lamp for wavelength calibration, making thorough optical lens evaluation and quality control work more efficient. It is a design. In terms of performance, the double beam method has a high baseline stability of 0.1%/hour, allowing for highly stable and highly accurate measurements. The device size is compact at 680 x 440 x 360 mm and can be installed on a desktop.
■Features
・For lenses such as single lenses, aspheric lenses, camera lenses, etc.
・Measurement wavelength range: 185 to 1,700 nm (new product MWIR 2.7 to 5.2 µm)
・Fully automatic lens Off-Axis reflection measurement function, coating evaluation
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Product
Spectrophotometer LINZA150 series spectrophotometer for optical lens evaluation and quality control
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Handling Company
Tokyo Instruments, Inc
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Categories
1 Models of Spectrophotometer LINZA150 series spectrophotometer for optical lens evaluation and quality control
| Product Image | Part Number | Price (excluding tax) | Measurement sample Lens assembly outer diameter | Measurement sample Lens curvature radius | Measurement sample focal length | Measurement sample lens diameter | Optical system, stage specifications Accuracy | Optical system, stage specifications Bandpass | Optical system, stage specifications Baseline stability | Optical system, stage specifications Incident angle during reflectance measurement | Optical system, stage specifications Light source | Optical system, stage specifications Maximum lens tilt angle | Optical system, stage specifications Measurement light size | Optical system, stage specifications Measurement wavelength range | Optical system, stage specifications Positioning during reflectance measurement | Optical system, stage specifications Repeatability -1 | Optical system, stage specifications Repeatability -2 | Optical system, stage specifications Spectrometer layout | Optical system, stage specifications Stray light | Optical system, stage specifications Wavelength accuracy | Optical system, stage specifications Wavelength feed interval | Optical system, stage specifications Wavelength feed repeatability | Optical system, stage specifications Wavelength feed speed | User interface, dimensions Connections | User interface, dimensions Dimensions, weight | User interface, dimensions Power supply |
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LINZA150 |
Available upon quote | W150 х L240 mm | -10~∞/+10~∞ mm |
Transmittance: -20~∞~+20 mm Reflectance: -15~∞~+15 mm |
Transmittance: 10~150mm Reflectance: 10~120mm |
±0.003Abs (1 Abs) ((NIST SRM930) ±0.003Abs (0.33Abs), ±0.006Abs (2 Abs) ((NIST SRM1930) |
2nm (185~990nm) 4nm (990~1,700nm) |
0.1%/hour (after 30 minutes of warm-up) | 12 degrees | Halogen lamp, deuterium lamp, Hg-Ar lamp (for wavelength calibration) | 55 degrees (when measuring off-axis reflectance) |
Transmission: 4 х 2.5 mm Reflectance: 1 х 1 mm |
185~1,700 nm, 380~1,700 nm | 0.01mm pitch |
0.0006Abs (1 Abs) ((NIST SRM930) 0.0002 Abs (0.33 Abs) |
0.005Abs (2 Abs) ((NIST SRM1930) 0.1 second integration, maximum deviation when measuring 10 times |
Czerny Turner type, with contrasting luminous flux | < 0.1% (@532 nm) | ±0.24 nm or less | 0.5~100nm | ±0.12 nm or less | 3,000 nm/min. (measured at 5 nm intervals) | USB 2.0 | W680 x D440 x H360 mm, 50 kg | 110/220VAC, 50/60Hz, 110Wt |
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About Company Handling This Product
- Japan