Spectroscopic measurement Spectrophotometer for optical element evaluation and quality control PHOTON RT series
Tokyo Instruments, Inc
About This Product
■Spectrophotometer PHOTON RT series for optical element evaluation and quality control
・LWIR 7.5～12.5 µm PHOTON RT 7512 New product released
- Fully automatic and highly accurate measurement of reflectance, transmittance, and polarization spectral characteristics of filters, mirrors, PBS cubes, etc. Can measure up to 185 to 5,200 nm with one device
■Product overview
PHTORN RT (manufactured by ESSENT Optics) is a spectrophotometer that fully automatically measures reflectance, transmittance, and polarization of filters, mirrors, PBS cubes, etc., and is ideal for evaluation and quality control of flat optical elements.
Equipped with a unique fully automatic optical arrangement that eliminates the need to change measurement accessories for each reflection or transmission measurement, unlike conventional spectrophotometers, it is possible to measure reflectance and transmission continuously. This greatly increases work efficiency and significantly reduces takt time. This device is recommended for use by manufacturers who routinely evaluate the film formation of optical elements and manage the quality of finished products.
Compatible with wide wavelength range from 185 nm to maximum 5,200 nm (fully automatic detector switching), beam shift correction during oblique incidence measurement (fully automatic detector position correction), equipped with P/S polarization element (fully automatic switching), for wavelength calibration Equipped with a mercury lamp and measurement data report creation function, it is designed to streamline thorough optical element evaluation and quality control work.
In terms of performance, the double beam method has a high baseline stability of 0.1%/hour, allowing for highly stable and highly accurate measurements. The device size is compact at 420 x 610 x 270 mm and can be installed on a desktop.
■Features
・For optical elements such as filters, mirrors, and PBS cubes
・Measurement wavelength range: 185 to 5,200 nm (new product LWIR 7.5 to 12.5 µm)
・Fully automatic reflection/transmission/polarization/angle resolution measurement
・Custom sample stage available
・Angle-resolved measurement (transmission measurement: 0 to 75°, reflection measurement: 8 to 75°)
・Measurement procedure programs can be constructed (e.g. reflection → transmission → polarization measurement, angle resolution)
・Beam spot size: minimum 2 mm
・With convenient measurement report creation function
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Product
Spectroscopic measurement Spectrophotometer for optical element evaluation and quality control PHOTON RT series
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Handling Company
Tokyo Instruments, Inc
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Categories
1 Models of Spectroscopic measurement Spectrophotometer for optical element evaluation and quality control PHOTON RT series
| Product Image | Part Number | Price (excluding tax) | Measurement component Sample size | Measurement component synchronous control | Measurement components Sample stage | Measuring components independent control | Optical system specifications Contrast luminous flux | Optical system specifications Incident angle range | Optical system specifications Measurement light size | Optical system specifications Measurement parameters | Optical system specifications Measurement wavelength range | Optical system specifications Photodetector rotation interval | Optical system specifications Sample table rotation interval | Optical system specifications Signal processing | Optical system specifications Spectrometer layout | Optical system specifications Spectrometer optical elements | Optical system specifications Wavelength feed interval | Optical system specifications Wavelength feed rate nm/min | Spectrometer specifications Bandpass | Spectrometer specifications Baseline stability | Spectrometer specifications Beam divergence angle | Spectrometer specifications Equipped with polarizer | Spectrometer specifications Light source | Spectrometer specifications Photometric accuracy-1 | Spectrometer specifications Photometric accuracy-2 | Spectrometer specifications Photometric accuracy-3 | Spectrometer specifications Photometry repeatability -1 | Spectrometer specifications Photometry repeatability -2 | Spectrometer specifications Stray light | Spectrometer specifications Wavelength accuracy | Spectrometer specifications Wavelength feed repeatability | User interface, dimensions Connections |
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PHOTON RT 0420 Ultra |
Available upon quote |
12 × 10 mm or more (incidence angle of 10 degrees or less) 12 × 25 mm or more (incident angle 10~75 degrees) Max Ø120mm with closed lit – |
Synchronous control of sample table and detector unit according to measurement content | 12 × 10 mm or more (transmission, reflection measurement) | Independent control of sample table and detector section | Double beam method |
Transmittance measurement: 0~75 degree Reflectance measurement: 8~75 degrees |
6x2mm | Transmittance, reflectance, optical density, absorbance |
185~1,700nm, 185~3,500nm, 185~4,900nm, 380~1,700nm, 380~3,500nm, 380~5,200nm 185~5,200nm |
0.01° | 0.01° | Averaging, smoothing, integral value calculation | Zerny turner type | Mirror Al+SiO2/MgF2 coating | 0.5~100nm | 3,000 nm/min. (measured at 5 nm intervals) |
0.6 nm@185~990 nm 1.2 nm@990~2,450 nm 2.4 nm@2,450~5,200 nm |
0.1%/hour @ UV-VIS (after 30 minutes warm-up operation) | ± 1 |
380~2,200 nm, 220~2,200 nm, 220~4,900 nm, 380~5,200 nm S, P, S+P+ (S+P) /2, Random, user defined S:P ratio |
Halogen lamp, deuterium lamp, IR lamp Hg-Ar lamp (for wavelength calibration) |
± 0.003Abs (1 Abs) ((using NIST SRM930) | ± 0.003Abs (0.33 Abs) ((using NIST SRM1930) | ± 0.006Abs (2 Abs) ((using NIST SRM1930) |
± 0.0004Abs (1 Abs) ((using NIST SRM930) ± 0.0001Abs (0.33 Abs) ((using NIST SRM1930) |
± 0.005Abs (2 Abs) ((using NIST SRM1930) 0.1 second integration, maximum deviation when measuring 10 times |
< 0.2% (@532 nm) | ±0.24 nm or less | ±0.12 nm or less | USB 2.0 |
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About Company Handling This Product
- Japan