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Spectroscopic measurement Spectrophotometer for optical element evaluation and quality control PHOTON RT seriesHandling Company
Tokyo Instruments, IncCategories
| Image | Part Number | Price (excluding tax) | Measurement components Sample stage | Measurement component Sample size | Measuring components independent control | Measurement component synchronous control | Spectrometer specifications Stray light | Spectrometer specifications Photometry repeatability -2 | Spectrometer specifications Photometry repeatability -1 | Spectrometer specifications Photometric accuracy-3 | Spectrometer specifications Photometric accuracy-2 | Spectrometer specifications Photometric accuracy-1 | Spectrometer specifications Wavelength feed repeatability | Spectrometer specifications Wavelength accuracy | Spectrometer specifications Equipped with polarizer | Spectrometer specifications Light source | Spectrometer specifications Baseline stability | Spectrometer specifications Beam divergence angle | Spectrometer specifications Bandpass | Optical system specifications Sample table rotation interval | Optical system specifications Measurement wavelength range | Optical system specifications Measurement light size | Optical system specifications Measurement parameters | Optical system specifications Wavelength feed interval | Optical system specifications Wavelength feed rate nm/min | Optical system specifications Contrast luminous flux | Optical system specifications Spectrometer optical elements | Optical system specifications Spectrometer layout | Optical system specifications Incident angle range | Optical system specifications Photodetector rotation interval | Optical system specifications Signal processing | User interface, dimensions Connections |
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PHOTON RT 0420 Ultra |
Available upon quote |
12 × 10 mm or more (transmission, reflection measurement) |
12 × 10 mm or more (incidence angle of 10 degrees or less) |
Independent control of sample table and detector section |
Synchronous control of sample table and detector unit according to measurement content |
< 0.2% (@532 nm) |
± 0.005Abs (2 Abs) ((using NIST SRM1930) |
± 0.0004Abs (1 Abs) ((using NIST SRM930) |
± 0.006Abs (2 Abs) ((using NIST SRM1930) |
± 0.003Abs (0.33 Abs) ((using NIST SRM1930) |
± 0.003Abs (1 Abs) ((using NIST SRM930) |
±0.12 nm or less |
±0.24 nm or less |
380~2,200 nm, 220~2,200 nm, 220~4,900 nm, 380~5,200 nm |
Halogen lamp, deuterium lamp, IR lamp |
0.1%/hour @ UV-VIS (after 30 minutes warm-up operation) |
± 1 |
0.6 nm@185~990 nm |
0.01° |
185~1,700nm, 185~3,500nm, |
6x2mm |
Transmittance, reflectance, optical density, absorbance |
0.5~100nm |
3,000 nm/min. (measured at 5 nm intervals) |
Double beam method |
Mirror Al+SiO2/MgF2 coating |
Zerny turner type |
Transmittance measurement: 0~75 degree |
0.01° |
Averaging, smoothing, integral value calculation |
USB 2.0 |
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Reviews shown here are reviews of companies.
