All Categories

History

Spectroscopic measurement SFG (sum frequency generation) spectroscopic system-SFG
Spectroscopic measurement SFG (sum frequency generation) spectroscopic system-Tokyo Instruments, Inc

Spectroscopic measurement SFG (sum frequency generation) spectroscopic system
Tokyo Instruments, Inc

Tokyo Instruments, Inc's Response Status

Response Rate

100.0%

Response Time

24.1hours

Relatively Fast Response


About This Product

■SFG (sum frequency generation) spectroscopy system

・Non-destructive, non-contact molecular vibration analysis of surfaces and interfaces (solid-liquid-gas) possible - Compatible with all surfaces and interfaces of solids, liquids, and gases ・Currently accepting demo measurements

■SFG (sum frequency generation) spectroscopy system product overview

SFG (sum frequency generation) spectroscopy is a vibrational spectroscopy method that utilizes second-order nonlinear optical effects. This spectroscopy has high interfacial selectivity, making it possible to analyze the molecular vibrational structure and orientation of monomolecular layers on surfaces or interfaces. Spectral identification of molecules by sweeping and measuring the wavelength of infrared light across the surface (interface), and analysis of molecular arrangement by measuring by changing the combination of polarization directions (SSP/SPS/PPP) You can. The wavelength range of infrared light is 4,300 to 625 cm-1 (2.3 μm to 16 μm) and the resolution is <6 cm-1. There are also Phase-Sensitive SFG modules and SFG microscope modules that can measure phase and intensity.

■Features

・Analysis of molecular vibrations on surfaces and interfaces (structure/orientation) ・Measurement of various interfaces (solid-gas, solid-liquid/liquid-gas, liquid-liquid interface) ・Non-destructive, non-contact measurement ・High sensitivity detection: Sub-mono layer measurement ・Able to measure various interfaces and surfaces including buried interfaces

■Applications

・Measurement and analysis of adhesion and bonding interfaces ・Interfacial reaction on electrode/catalyst surfaces ・Structure analysis of surfaces and interfaces ・Surface chemical reactions and surface dynamics in the atmosphere ・Research on electrochemistry, epitaxial growth, etc.

■Options

・Wavelength extension 625 cm-1~ ・Phase-Sensitive SFG measurement ・SFG microscope ・Double resonance: Add OPG as wavelength tunable visible laser light ・High resolution option: spectral resolution 2 cm-1 ・SHG spectroscopy ・Sample purge box

  • Product

    Spectroscopic measurement SFG (sum frequency generation) spectroscopic system

Share this product


90+ people viewing


Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of Spectroscopic measurement SFG (sum frequency generation) spectroscopic system

Image Part Number Price (excluding tax) Measurement system Detection system Spatial resolution Wavelength tunable laser Sensitivity Engineering Excitation laser repetition frequency Excitation laser method Pump laser pulse width stability Excitation laser pulse width Excitation laser pulse energy stability Excitation laser pulse energy (1,064nm) Spectrometer focal length Spectrometer slit width Polarized infrared light Polarized visible light Polarized SFG light Beam diameter (at sample) SFG microscopic measurement option Wavelength range (infrared light) SFG microscopic measurement option Wavelength resolution SFG microscopic measurement option Visible light wavelength SFG spectrometry irradiation beam geometry SFG spectrometry wavelength range (infrared light) SFG spectrometry wavelength sweep SFG spectrometry wavelength resolution SFG spectroscopy visible light wavelength SFG spectrometry incident beam angle SFG spectrometry sample irradiation geometry
Spectroscopic measurement SFG (sum frequency generation) spectroscopic system-Part Number-SFG

SFG

Available upon quote

Spectrometer, PMT detector

≦10μm: Objective lens 10x
≦5μm: Objective lens 20x (high resolution option)

Method Optical parametric oscillator (OPG)/difference frequency generator (DFG)

Air-water interface measurement possible

Same housing as SFG spectroscopy optical system, microscopic measurement possible by switching the optical system

50Hz

Semiconductor laser pumped solid-state laser

±1 ps

28ps±3ps

≦0.5%

35 mJ

200mm

Variable, manual

Straight line, vertical polarization/horizontal polarization switchable by software

Straight line, vertical polarization/horizontal polarization switchable by software

Polarizer for analysis (manual, electric option)

Variable (approximately 150~600 μm)

2.5~5 μm (2,000~4,000 cm-1)

≦6 cm-1

532nm

Non-collinear (option: collinear)

2.3~10 μm (1,000~4,300 cm-1)

Electric, software controlled

≦6 cm-1 (≦2 cm-1 optional)

532 nm (1,064 nm option)

Fixed, visible light: approximately 60°
Infrared light: about 55°

Visible light/infrared light: Upper diagonal direction
SFG light: Reflection (other geometries are also possible)

Customers who viewed this product also viewed

Reviews shown here are reviews of companies.

See More Infrared Spectrophotometers Products

Other products of Tokyo Instruments, Inc

Reviews shown here are reviews of companies.


View more products of Tokyo Instruments, Inc

About Company Handling This Product

Response Rate

100.0%


Response Time

24.1hrs

Company Overview

Tokyo Instruments, Inc., established in 1981, and headquartered in Tokyo, Japan, is a manufacturer of opto-ele...

See More

  • Japan

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2025 Metoree