Spectroscopic measurement SFG (sum frequency generation) spectroscopic system
Tokyo Instruments, Inc
About This Product
■SFG (sum frequency generation) spectroscopy system
・Non-destructive, non-contact molecular vibration analysis of surfaces and interfaces (solid-liquid-gas) possible
- Compatible with all surfaces and interfaces of solids, liquids, and gases
・Currently accepting demo measurements
■SFG (sum frequency generation) spectroscopy system product overview
SFG (sum frequency generation) spectroscopy is a vibrational spectroscopy method that utilizes second-order nonlinear optical effects. This spectroscopy has high interfacial selectivity, making it possible to analyze the molecular vibrational structure and orientation of monomolecular layers on surfaces or interfaces. Spectral identification of molecules by sweeping and measuring the wavelength of infrared light across the surface (interface), and analysis of molecular arrangement by measuring by changing the combination of polarization directions (SSP/SPS/PPP) You can.
The wavelength range of infrared light is 4,300 to 625 cm-1 (2.3 μm to 16 μm) and the resolution is <6 cm-1. There are also Phase-Sensitive SFG modules and SFG microscope modules that can measure phase and intensity.
■Features
・Analysis of molecular vibrations on surfaces and interfaces (structure/orientation)
・Measurement of various interfaces (solid-gas, solid-liquid/liquid-gas, liquid-liquid interface)
・Non-destructive, non-contact measurement
・High sensitivity detection: Sub-mono layer measurement
・Able to measure various interfaces and surfaces including buried interfaces
■Applications
・Measurement and analysis of adhesion and bonding interfaces
・Interfacial reaction on electrode/catalyst surfaces
・Structure analysis of surfaces and interfaces
・Surface chemical reactions and surface dynamics in the atmosphere
・Research on electrochemistry, epitaxial growth, etc.
■Options
・Wavelength extension 625 cm-1~
・Phase-Sensitive SFG measurement
・SFG microscope
・Double resonance: Add OPG as wavelength tunable visible laser light
・High resolution option: spectral resolution 2 cm-1
・SHG spectroscopy
・Sample purge box
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Product
Spectroscopic measurement SFG (sum frequency generation) spectroscopic system
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Handling Company
Tokyo Instruments, Inc
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Categories
1 Models of Spectroscopic measurement SFG (sum frequency generation) spectroscopic system
| Product Image | Part Number | Price (excluding tax) | Beam diameter (at sample) | Engineering | Excitation laser method | Excitation laser pulse energy (1,064nm) | Excitation laser pulse energy stability | Excitation laser pulse width | Excitation laser repetition frequency | Measurement system Detection system | Polarized SFG light | Polarized infrared light | Polarized visible light | Pump laser pulse width stability | SFG microscopic measurement option Visible light wavelength | SFG microscopic measurement option Wavelength range (infrared light) | SFG microscopic measurement option Wavelength resolution | SFG spectrometry incident beam angle | SFG spectrometry irradiation beam geometry | SFG spectrometry sample irradiation geometry | SFG spectrometry wavelength range (infrared light) | SFG spectrometry wavelength resolution | SFG spectrometry wavelength sweep | SFG spectroscopy visible light wavelength | Sensitivity | Spatial resolution | Spectrometer focal length | Spectrometer slit width | Wavelength tunable laser |
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SFG |
Available upon quote | Variable (approximately 150~600 μm) | Same housing as SFG spectroscopy optical system, microscopic measurement possible by switching the optical system | Semiconductor laser pumped solid-state laser | 35 mJ | ≦0.5% | 28ps±3ps | 50Hz | Spectrometer, PMT detector | Polarizer for analysis (manual, electric option) | Straight line, vertical polarization/horizontal polarization switchable by software | Straight line, vertical polarization/horizontal polarization switchable by software | ±1 ps | 532nm | 2.5~5 μm (2,000~4,000 cm-1) | ≦6 cm-1 |
Fixed, visible light: approximately 60° Infrared light: about 55° |
Non-collinear (option: collinear) |
Visible light/infrared light: Upper diagonal direction SFG light: Reflection (other geometries are also possible) |
2.3~10 μm (1,000~4,300 cm-1) | ≦6 cm-1 (≦2 cm-1 optional) | Electric, software controlled | 532 nm (1,064 nm option) | Air-water interface measurement possible |
≦10μm: Objective lens 10x ≦5μm: Objective lens 20x (high resolution option) |
200mm | Variable, manual | Method Optical parametric oscillator (OPG)/difference frequency generator (DFG) |
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About Company Handling This Product
- Japan