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Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series-191F-10
Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series-Asahiko Trading Co., Ltd.

Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series
Asahiko Trading Co., Ltd.

Asahiko Trading Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

1.8hours

Very Fast Response


About This Product

■Summary

Reflectance and Transmittance Measurement Systems The GS-191 series reflectance and optical transmittance measurement systems provide complete spectral and color characterization of thin film coatings, typically in scan times of less than 1 second. The 191 reflectance meter is the only device that can non-destructively measure the reflectance of the first surface of transparent substrates up to 0.3 mm thick, excluding 100% of the reflectance of the back surface. It is also possible to characterize the intermediate reflectance of the second surface or layer at the intermediate surface by eliminating reflections from other surfaces within the substrate. The measurement system is optimized for the sample type and desired measurement result and is available in multiple system configurations, including specular (shiny) or diffuse (non-shiny) samples. Choose the system that best meets your needs with our product selection guide below.

■Features

The 191F reflectance measurement head is a fixed angle of incidence model from 0 to 45°. A portable model with variable incidence angle is also available. Capable of first-plane or total specular reflection on glass, plastic, metal, and polished substrates, it can be used for sample sizes as thin as 0.15 mm. The wavelength band is from 365nm to 1,100nm. ・With a short scan time of 300 msec per measurement, complete spectral and color characteristics can be evaluated non-destructively. ・Can measure the first side of glass substrates up to 0.15mm thick separately without masking the second side. ・Total reflectance measurement or identification of internal optical interfaces ・Test function for diffused and mirror surfaces ・Can be configured as handheld, semi-automatic, fully automatic rotary system, robot loading, etc. ・Thin film spectral reflectance/transmittance measurement system ・Capable of measuring samples up to 0.3mm thick ・Wavelength range: 365-1,100nm ・Supports fully automatic/semi-automatic high-speed measurement ・Can be customized according to your request

■Measurable units

Spectral reflectance and chromaticity (CIE1931 x,y), tristimulus values ​​XYZ, CIE Lab, CIE Luv

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    Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series

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1 Models of Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series

Image Part Number Price (excluding tax) Observation angle Chromaticity (CIE1931x,y) Color data Irradiation spot diameter Measurement type Measurement speed Wavelength range Calibration reference standard Minimum sample size Maximum sample size Average reflection Compatible sample Spectral reflectance Spectral data Light source weighting Light source incidence angle Tristimulus values ​​(CIE 1931 X,Y,Z) Head dimensions and weight Minimum sample thickness Transparent Minimum sample thickness Opaque Maximum sample thickness Lab color space (CIE 1976 L*,a*,b*)
Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series-Part Number-191F-10

191F-10

Available upon quote

10°

±0.002

CIE tristimulus X,Y,Z, 2° or 10° visual field, (L*,a*,b*) , (x,y) , (u',v') and other parameters

1mm×10μm

Single layer surface or total specular reflection

≈300-3,000ms

380-940nm

150mm BK-7 optical glass

25mm diameter or square 25mm x 25mm

None

±0.1

Glass/plastic/metal/polished base

±0.05%

Reflectance as a function of wavelength

A light source, B light source, C light source, D65 light source, or user-specified custom light source

10°

±0.05

Height: 230mm Width: 150mm Depth: 150mm Weight: 1.6kg

0.4mm

None

None

L*±0.5a*,b*±0.4

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About Company Handling This Product

Response Rate

100.0%


Response Time

1.8hrs

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