Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series
Asahiko Trading Co., Ltd.
About This Product
■Summary
Reflectance and Transmittance Measurement Systems The GS-191 series reflectance and optical transmittance measurement systems provide complete spectral and color characterization of thin film coatings, typically in scan times of less than 1 second. The 191 reflectance meter is the only device that can non-destructively measure the reflectance of the first surface of transparent substrates up to 0.3 mm thick, excluding 100% of the reflectance of the back surface. It is also possible to characterize the intermediate reflectance of the second surface or layer at the intermediate surface by eliminating reflections from other surfaces within the substrate.
The measurement system is optimized for the sample type and desired measurement result and is available in multiple system configurations, including specular (shiny) or diffuse (non-shiny) samples. Choose the system that best meets your needs with our product selection guide below.
■Features
The 191F reflectance measurement head is a fixed angle of incidence model from 0 to 45°. A portable model with variable incidence angle is also available. Capable of first-plane or total specular reflection on glass, plastic, metal, and polished substrates, it can be used for sample sizes as thin as 0.15 mm. The wavelength band is from 365nm to 1,100nm.
・With a short scan time of 300 msec per measurement, complete spectral and color characteristics can be evaluated non-destructively.
・Can measure the first side of glass substrates up to 0.15mm thick separately without masking the second side.
・Total reflectance measurement or identification of internal optical interfaces
・Test function for diffused and mirror surfaces
・Can be configured as handheld, semi-automatic, fully automatic rotary system, robot loading, etc.
・Thin film spectral reflectance/transmittance measurement system
・Capable of measuring samples up to 0.3mm thick
・Wavelength range: 365-1,100nm
・Supports fully automatic/semi-automatic high-speed measurement
・Can be customized according to your request
■Measurable units
Spectral reflectance and chromaticity (CIE1931 x,y), tristimulus values XYZ, CIE Lab, CIE Luv
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Product
Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series
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Handling Company
Asahiko Trading Co., Ltd.
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Categories
1 Models of Optical measurement equipment Reflectance/transmittance measuring instrument Reflectance/transmittance measurement system GS-191 series
| Product Image | Part Number | Price (excluding tax) | Average reflection | Calibration reference standard | Chromaticity (CIE1931x,y) | Color data | Compatible sample | Head dimensions and weight | Irradiation spot diameter | Lab color space (CIE 1976 L*,a*,b*) | Light source incidence angle | Light source weighting | Maximum sample size | Maximum sample thickness | Measurement speed | Measurement type | Minimum sample size | Minimum sample thickness Opaque | Minimum sample thickness Transparent | Observation angle | Spectral data | Spectral reflectance | Tristimulus values (CIE 1931 X,Y,Z) | Wavelength range |
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191F-10 |
Available upon quote | ±0.1 | 150mm BK-7 optical glass | ±0.002 | CIE tristimulus X,Y,Z, 2° or 10° visual field, (L*,a*,b*) , (x,y) , (u',v') and other parameters | Glass/plastic/metal/polished base | Height: 230mm Width: 150mm Depth: 150mm Weight: 1.6kg | 1mm×10μm | L*±0.5a*,b*±0.4 | 10° | A light source, B light source, C light source, D65 light source, or user-specified custom light source | None | None | ≈300-3,000ms | Single layer surface or total specular reflection | 25mm diameter or square 25mm x 25mm | None | 0.4mm | 10° | Reflectance as a function of wavelength | ±0.05% | ±0.05 | 380-940nm |
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