Product
Wafer surface particle counterHandling Company
Media Institute Co., Ltd.Categories
Product Image | Part Number | Price (excluding tax) | Detection sensitivity | Detection/scanning method | Light source | Mass (kg) | Measurement target | Reproducibility | Size (mm) | Wafer size |
---|---|---|---|---|---|---|---|---|---|---|
Particle counter |
Available upon quote | Bare 80nm | Spiral scanning method | Violet-LD | 600 | Bare wafer/wafer with film | Σ/X ≦1% (99% or more) | 860 (W) ×900 (D) ×1,650 (H) | 50mm~200mm |