Film surface defect inspection and measurement equipment EasyInspect
Media Institute Co., Ltd.
About This Product
■Product overview
Dr.Schenk provides over 16,000 testing solutions worldwide. Inspection and measurement solutions implemented vary by region and customer, including plastics, textile materials, nonwovens, paper, metals, glass, solar, semiconductors, and optical media.
■Features
・Suitable for a wide range of applications such as high-performance films, various sheets, nonwoven fabrics, meshes, separators, electrodes, etc.
・Membrane quality distribution (film thickness, porosity, etc.) can also be measured at the same time (EasyMeasure)
・Used in mass production lines of 300 meters/min or more
・Can be configured with less than half the number of cameras compared to other companies' inspection equipment, great cost advantage
- Reliably classify defects using MIDA (Multiple Image Defect Analysis) technology that combines multiple optical channels
・Detection of periodicity and streak defects
・Custom support for various needs such as in-line and offline inspection
・No.1 defect classification function in the industry
・Compatible with network systems
・I/F with commercially available markers
・Screen layout that can be set freely
function
■Ultra high-speed smart camera with built-in controller
By creating images in the camera section, it is possible to speed up the system and prevent data loss.
■Stable light intensity/long life LED lighting device
The illumination LED that illuminates the film changes its light intensity and wavelength depending on the temperature. This change causes differences in the image data. By keeping the temperature of the illumination constant, we are able to obtain stable image data and extend the lifespan of the illumination.
■MIDA (multiple optical system measurement)
There are times when a single channel (optical system) cannot capture defects. In these cases, multiple optical systems (bright field, dark field, transmission, reflection) can be combined to enable defect detection. One camera can support up to 4 channels.
■Film inspection
Achieves defect detection and classification by analyzing images of multiple optical systems acquired simultaneously using high-speed switching technology.
■Nonwoven fabric inspection
ABI/Virtual X-Ray technology removes noise caused by materials specific to nonwoven fabric inspection and only detects true defects.
■Oblique illumination measurement Defect detection in MD direction (Oblique illumination: Oblique)
By irradiating light from the side, it is possible to highlight wrinkles, creases, and lines.
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Product
Film surface defect inspection and measurement equipment EasyInspect
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Handling Company
Media Institute Co., Ltd.
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Categories
1 Models of Film surface defect inspection and measurement equipment EasyInspect
| Product Image | Part Number | Price (excluding tax) |
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EasyInspect |
Available upon quote |
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