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  4. Measuring instrument Contributes to quality improvement by linking data between pre- and post-processes Wafer element visual inspection equipment NVI-211 series (YAC GARTER CO .,LTD)
Measuring instrument Contributes to quality improvement by linking data between pre- and post-processes Wafer element visual inspection equipment NVI-211 series-NVI-211
Measuring instrument Contributes to quality improvement by linking data between pre- and post-processes Wafer element visual inspection equipment NVI-211 series-YAC GARTER CO .,LTD

Measuring instrument Contributes to quality improvement by linking data between pre- and post-processes Wafer element visual inspection equipment NVI-211 series
YAC GARTER CO .,LTD

About This Product

This equipment performs visual inspections for chipping, cracks, foreign objects, etc. that occur on chips on wafers during the pre-process of semiconductor and electronic component manufacturing. By incorporating it into the production line, it is possible to read data from the previous process and reflect the results of visual inspection in the subsequent process.

■Improve measurement accuracy by utilizing data

It is possible to register multiple image data of non-defective products and create data that will serve as judgment criteria. By using the created master data, highly accurate measurements are achieved without being affected by the wafer elements surrounding the inspection target.

■Auto focus function

Equipped with an autofocus function that prevents out-of-focus during measurement due to the thickness of the wafer element. It enables the acquisition of clear images and achieves stable image inspection.

  • Product

    Measuring instrument Contributes to quality improvement by linking data between pre- and post-processes Wafer element visual inspection equipment NVI-211 series

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1 Models of Measuring instrument Contributes to quality improvement by linking data between pre- and post-processes Wafer element visual inspection equipment NVI-211 series

Image Part Number Price (excluding tax) Power supply Image inspection function Insertion tact Target products External dimensions Supply method
Measuring instrument Contributes to quality improvement by linking data between pre- and post-processes Wafer element visual inspection equipment NVI-211 series-Part Number-NVI-211

NVI-211

Available upon quote

Single phase AC200V / AC220V / AC230V
50/60 [Hz] (Transformer tap switching)

2,448×2,058 pixel camera
Theoretical resolution 1.73μm

0.075 seconds/piece

Various chip parts

W890×H1,470×D930 [mm]

Wafer ring (up to 8 inches)

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About Company Handling This Product

YAC GARTER CO .,LTD

Company Overview

YAC Garter Co., Ltd., established in 1957 and headquartered in Ome-shi, Tokyo, is a manufacturer of electronic...

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  • Japan

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Visual Inspection Systems
Visual Inspection Systems　YAC GARTER CO .,LTD
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