X-ray non-destructive inspection system small tilting model TXV-CH4090FD-TXV-CH4090FD

X-ray non-destructive inspection system small tilting model TXV-CH4090FD
Toshiba IT & Control Systems Corporation

About This Product

■ApplicationsMounted substrates, BGA, electronic components, devices, sensors, resins, etc.

This is a model for inspecting mounted boards that pursues ease of use in the field. This system is ideal for inspecting the solder of mounted boards using Toshiba's X-ray sensing technology, and can obtain clear X-ray images of BGA and component solder conditions. In addition, the excellent user interface allows for easy and efficient inspection.

■X-ray generatorIt is a closed type with a maximum tube voltage of 90kV and a minimum focal length of 5μm. Unlike the open type, the closed type does not require detailed maintenance and is easy to handle.

■FPD (Flat Panel Detector)FPD has a wide dynamic range and can obtain fluoroscopic images that are less affected by halation.

■Tilt observationIn addition to the X, Y, and Z axes, the tilt axis allows transparent observation from an oblique direction. The sample table moves in the X and Y axes, and the integrated X-ray generator and X-ray sensor mechanism moves in the Z and tilt axes.

■Rich functions・Image analysis, image measurement, image/mechanism playback function, video creation, pitch feed function
・Image analysis: pseudo color display, profile, histogram, 3D display
・Image measurement: wettability (including shading correction), wire flow, dimension measurement between two points, void area measurement, BGA measurement (rate)

■Measurement function/image analysis・Measurement functions: wettability (including shading correction), wire flow, dimension measurement between two points, void area measurement, BGA measurement (void ratio)
・Analysis functions: pseudo color, profile, histogram, 3D display

■Options2-axis rotation device, work rotation table, exterior camera, carbon sample table

Model
There are 1 models for this product.

Product
X-ray non-destructive inspection system small tilting model TXV-CH4090FD

Handling Company
Toshiba IT & Control Systems Corporation

Categories

Testing Equipment

PCB Inspection Equipment

Testing Equipment

X-ray Inspection System

Testing Equipment

Non-Destructive Testing (NDT) Systems

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Last viewed: 1 hour ago

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1 Models of X-ray non-destructive inspection system small tilting model TXV-CH4090FD

Image	Part Number	Price (excluding tax)	Maximum external diameter of sample (mm)	Sample table size (mm)	Tilt angle (degrees)	Magnification (x)	X-ray detector	X-ray minimum focus dimension (μm)	X-ray output (kV)
	TXV-CH4090FD	Available upon quote	350 (W) ×400 (D) ×50 (H)	400×350	0~60	10~153	FPD (Flat Panel Detector)	5	90

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About Company Handling This Product

Toshiba IT & Control Systems Corporation

Company Overview

Toshiba IT and Control Systems Corporation, established in 1983, and based in Tokyo, Japan is a manufacturer a...

Japan

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X-ray non-destructive inspection system small tilting model TXV-CH4090FD Toshiba IT & Control Systems Corporation

About This Product

■Applications

■X-ray generator

■FPD (Flat Panel Detector)

■Tilt observation

■Rich functions

■Measurement function/image analysis

■Options

1 Models of X-ray non-destructive inspection system small tilting model TXV-CH4090FD

TXV-CH4090FD

Customers who viewed this product also viewed

Other products of Toshiba IT & Control Systems Corporation

About Company Handling This Product

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X-ray non-destructive inspection system small tilting model TXV-CH4090FD
Toshiba IT & Control Systems Corporation