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  4. Scattered light photoelastic stress meter SLP-2000 (Irie Co., Ltd.)
Scattered light photoelastic stress meter SLP-2000-SLP-2000
Scattered light photoelastic stress meter SLP-2000-Irie Co., Ltd.

Scattered light photoelastic stress meter SLP-2000
Irie Co., Ltd.

Irie Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

13.9hours

Company Review

4.8

Relatively Fast Response

About This Product

■Scattered light photoelastic stress meter SLP-2000

This device uses scattered light photoelasticity to measure stress distribution in chemically strengthened glass due to Li+ ⇔ Na+ exchange, which cannot be measured with conventional surface stress meters that use guided light. If there is a K+ layer near the surface, the cross-sectional stress distribution analysis will be performed by combining it with information from the FSM-6000 surface stress meter that uses guided light.

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    Scattered light photoelastic stress meter SLP-2000

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1 Models of Scattered light photoelastic stress meter SLP-2000

Image Part Number Price (excluding tax) Measurement accuracy Measuring range Measurement shape Measurement target Measurement resolution Light source Prism refractive index
Scattered light photoelastic stress meter SLP-2000-Part Number-SLP-2000

SLP-2000

Available upon quote

Depth 50um or more from the surface Stress ±10MPa Depth ±10um (relative to standard glass)

Stress value 0-2,000MPa, stress layer depth 10-600um

Flat surface -1,000R　10×10mm or more

Chemically strengthened glass, two-stage chemically strengthened glass, physically strengthened glass

Stress 5MPa Depth 5um

LD520nm±10nm 18mW Class 3B or 405±10nm 5mW Class 3B

1.518 @518nm / 1.530 @405nm

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About Company Handling This Product

Irie Co., Ltd.

Response Rate

100.0%

Response Time

13.9hrs

Company Review

4.8
  • Japan

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