XYZθφ scanning slit CM collimation
Irie Co., Ltd.
About This Product
■Features
・Silicon detector 190-1,150nm
・InGaAs detector 650-1,800nm
・InGaAs (extended) detector 1,000 to 2,300 or 2,500nm
・Beam diameter ~100μm~3mm (1.5mm for expanded InGaAs)
・25μm slit pair (Si), 0.1~2μm sampling interval
・50μm slit pair using InGaAs, 0.1 to 2μm sampling interval
・Real-time ±1mr Real-time divergence, pointing measurement accuracy
・Port powered USB2.0, flexible 3m cable, no power brick
・0.1μm sampling and resolution
・Linear and log X-Y profiles, centroids
・Profile zoom & slit width correction
・Real-time multiplex Z plane scanning slit system
・Real-time XYZ profile, focus position
・Real-time M^2, divergence, collimation, alignment
■Application
・Laser printing & marking
・Medical laser
・Diode laser system
・Focusing of optical fiber communication assemblies For re-imaging waveguides and fiber ends
・LensPlate2™ option
・Development, production, field service
・CW pulse laser, Φμm≧［500/ (PRR in kHz)］
・M² measurement using M2DU stage possible
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Product
XYZθφ scanning slit CM collimation
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Handling Company
Irie Co., Ltd.
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Categories
1 Models of XYZθφ scanning slit CM collimation
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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S-BMS2-CM4-Si-5 |
Available upon quote |
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About Company Handling This Product
- Japan