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  2. Measuring Equipment
  3. Laser Beam Profilers
  4. XYZθφ scanning slit CM collimation (Irie Co., Ltd.)
XYZθφ scanning slit CM collimation-S-BMS2-CM4-Si-5
XYZθφ scanning slit CM collimation-Irie Co., Ltd.

XYZθφ scanning slit CM collimation
Irie Co., Ltd.

About This Product

■Features

・Silicon detector 190-1,150nm ・InGaAs detector 650-1,800nm ・InGaAs (extended) detector 1,000 to 2,300 or 2,500nm ・Beam diameter ~100μm~3mm (1.5mm for expanded InGaAs) ・25μm slit pair (Si), 0.1~2μm sampling interval ・50μm slit pair using InGaAs, 0.1 to 2μm sampling interval ・Real-time ±1mr Real-time divergence, pointing measurement accuracy ・Port powered USB2.0, flexible 3m cable, no power brick ・0.1μm sampling and resolution ・Linear and log X-Y profiles, centroids ・Profile zoom & slit width correction ・Real-time multiplex Z plane scanning slit system ・Real-time XYZ profile, focus position ・Real-time M^2, divergence, collimation, alignment

■Application

・Laser printing & marking ・Medical laser ・Diode laser system ・Focusing of optical fiber communication assemblies For re-imaging waveguides and fiber ends ・LensPlate2™ option ・Development, production, field service ・CW pulse laser, Φμm≧［500/ (PRR in kHz)］ ・M² measurement using M2DU stage possible

  • Product

    XYZθφ scanning slit CM collimation

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1 Models of XYZθφ scanning slit CM collimation

Image Part Number Price (excluding tax)
XYZθφ scanning slit CM collimation-Part Number-S-BMS2-CM4-Si-5

S-BMS2-CM4-Si-5

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About Company Handling This Product

Irie Co., Ltd.

  • Japan

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