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  2. Measuring Equipment
  3. Laser Beam Profilers
  4. XYZθφ scanning slit beam profiler BeamMap2 (Irie Co., Ltd.)
XYZθφ scanning slit beam profiler BeamMap2-S-BMS2-4XY-Si-250
XYZθφ scanning slit beam profiler BeamMap2-Irie Co., Ltd.

XYZθφ scanning slit beam profiler BeamMap2
Irie Co., Ltd.

About This Product

■Features

・Silicon detector 190-1,150nm ・InGaAs detector 650-1,800nm ・InGaAs (extended) detector 1,000 to 2,300 or 2,500nm - Check the worksheet to determine the appropriate plane spacing for your application. ・Beam diameter 5μm to 4mm, up to 2μm in knife edge mode ・Port powered USB2.0, flexible 3m cable, no power brick ・0.1μm sampling and resolution ・Linear and log X-Y profiles, centroids ・Profile zoom & slit width correction ・Real-time multiplex Z-plane scanning slit system ・Real-time XYZ profile, focus position ・Real-time M^2, divergence, collimation, alignment

■Application

・Laser printing & marking ・Medical laser ・Diode laser system Focusing of fiber optic communication assemblies – for reimaging waveguides and fiber ends ・LensPlate2™ option ・Development/Production/Field service ・CW pulse laser, Φμm≧［500/ (PRR in kHz)］ ・M² measurement using M2DU stage possible

  • Product

    XYZθφ scanning slit beam profiler BeamMap2

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1 Models of XYZθφ scanning slit beam profiler BeamMap2

Image Part Number Price (excluding tax)
XYZθφ scanning slit beam profiler BeamMap2-Part Number-S-BMS2-4XY-Si-250

S-BMS2-4XY-Si-250

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About Company Handling This Product

Irie Co., Ltd.

  • Japan

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