XY scanning slit beam profiler Beam‘R2
Irie Co., Ltd.
About This Product
■Features
・Silicon detector 190-1,150nm
・InGaAs detector 650-1,800nm
・InGaAs (extended) detector 1,000 to 2,300 or 2,500nm
・Beam diameter 5μm to 4mm, 2μm in knife edge mode
・Port powered USB2.0, flexible 3m cable, no power brick
・0.1μm sampling and resolution
・Linear and log X-Y profiles, centroids
・Profile zoom & slit width correction
・Inexpensive and high precision
・M^2 options – beam propagation analysis, divergence, focus
■Application
・Laser printing & marking
・Medical laser
・Diode laser system
・Focusing of optical fiber communication assemblies For re-imaging waveguides and fiber ends
・LensPlate2™ option
・Development/Production/Field service
・CW pulse laser, Φμm≧［500/ (PRR in kHz)］
・M² measurement using M2DU stage possible
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Product
XY scanning slit beam profiler Beam‘R2
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Handling Company
Irie Co., Ltd.
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Categories
1 Models of XY scanning slit beam profiler Beam‘R2
| Product Image | Part Number | Price (excluding tax) |
|---|---|---|
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S-BR2-Si |
Available upon quote |
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About Company Handling This Product
- Japan