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Nano roughness height measuring instrument Nano Seven TN-A1-TN-A1
Nano roughness height measuring instrument Nano Seven TN-A1-Tsukumo Engineering Co., Ltd.

Nano roughness height measuring instrument Nano Seven TN-A1
Tsukumo Engineering Co., Ltd.

Tsukumo Engineering Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

0.2hours

Very Fast Response


About This Product

NanoSeven uses a non-contact method using laser light to measure the surface roughness and step height of an object with sub-nano level accuracy in a short time and over a wide range.

■Feature 1: Shortened measurement time

Measures the surface roughness of a 100 µm x 100 µm area in just 25 seconds. *When measuring at a pitch of 3 µm. AFM generally requires about 15 minutes.

■Feature 2 Wide range measurement

The measurement range of NanoSeven depends on the movable area of ​​the sample stage. It can move up to 45mm on the X-axis (horizontal axis) and 45mm on the Y-axis (depth axis), so it is theoretically possible to measure within this area at once. It is also possible to carry out large-scale modifications to the sample stage, making it possible to measure a wider range.

■Feature 3 No need for anti-vibration stand

The optical heterodyne interference measurement method used by NanoSeven differs from general white interference measurement in that it does not use interference fringes for measurement, so it is resistant to noise from external disturbances and does not require a vibration isolation table.

■Feature 4 Easy measurement

In principle, no special pretreatment of the measurement object is required. We also do not use vacuum equipment. It has an easy-to-operate design that can be operated without a dedicated operator.

■Feature 5 High resolution

NanoSeven uses an optical heterodyne interference measurement method, which is a measurement method based on the phase difference of light wavelengths, so it is possible to measure with a height resolution of 0.1 nm (nanometers) or less.

■Feature 6 Non-contact measurement

NanoSeven is a non-contact measuring instrument that uses a red laser, so it does not have any negative effect on the object being measured. Also, since it is non-contact, it can perform faster measurements compared to contact-type measuring instruments. The laser output is low, only a few milliwatts, making it an energy-saving and safe design.

■Feature 7 Low running cost

There is no need for incidental equipment such as anti-vibration tables or vacuum equipment during installation, and there are almost no consumables, so running costs can be kept down after purchase. Additionally, since no dedicated operator is required, it also contributes to reducing labor costs.

■Main specifications of Nano Seven <TN-A1>

-Measurement consists of the main unit, control box, and measurement PC. - Compact size that can be installed on a tabletop. - Measurement is possible over a wide range of X45mm x Y45mm.

■Comparison with other nanometers

Compared to other measuring devices, NanoSeven can measure a wide range of heights at the nano level.

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    Nano roughness height measuring instrument Nano Seven TN-A1

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1 Models of Nano roughness height measuring instrument Nano Seven TN-A1

Image Part Number Price (excluding tax) Height resolution Power supply Measurement method Body weight Maximum travel amount Objective lens External dimensions Reference height measurement range Light source Accessories
Nano roughness height measuring instrument Nano Seven TN-A1-Part Number-TN-A1

TN-A1

Available upon quote

0.1nm (nanometer)

AC100V

Contactless method

Approximately 27kg

X:45mm/Y:45mm

Magnification 20X / NA0.4

Body: W220×D550×H420mm
Control box: W172 x D350 x H315mm

0.5nm~300nm

He-Ne laser (632.8nm)

Noise filter

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About Company Handling This Product

Response Rate

100.0%


Response Time

0.2hrs

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