Semiconductor ASIC gate array-S1L60000
Semiconductor ASIC gate array-Seiko Epson Corporation

Semiconductor ASIC gate array
Seiko Epson Corporation


About This Product

■Gate array Epson's gate arrays allow you to freely set the power supply and signal arrangement, making them ideal for replacing existing products. In 2012, in response to customer requests, we newly developed the S1L5V000 series, which uses a 0.35um process and supports a 5V single power supply, contributing to improved integration and power consumption. Gate arrays are constructed by preparing a base bulk in which transistors (basic cells) are arranged in regular arrays (columns) in advance, and then constructing an LSI using only the wiring process. It is generally characterized by a short development period. In addition, it is possible to select the base bulk according to the number of gates and terminals. ■ASIC product lineup Epson ASIC has a lineup of gate arrays, embedded arrays, and standard cells. By adopting these series, we will provide optimal solutions to our customers. ・Extensive support history since 1982 ・Integrated operation with in-house design and related factory production ・ISO9001, IATF16949 certification

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    Semiconductor ASIC gate array

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3 Models of Semiconductor ASIC gate array

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Product Image Part Number Price (excluding tax) Delay time Input buffer Delay time Output buffer Delay time internal gate Features I/O level Input mode Output mode Series name Status
Semiconductor ASIC gate array-Part Number-S1L60000

S1L60000

Available upon quote Tpd=270ps (at 2.5V, F/O=2, standard wiring load) Tpd=1,600ps (at 2.5V, CL=15pF) Tpd=107ps (at 2.5V, F/O=1, standard wiring load) Ultra-high integration (0.25µm CMOS 3-layer/4-layer wiring process adopted), high-speed operation (internal gate delay 107ps at 2.5V 2-input NAND Typ.), etc. CMOS, LVTTL, PCI-3.3V CMOS, LVTTL, pullup/pulldown, Schmitt, level shifter, fail-safe, gated Normal, open-drain, 3-state, bidirectional, level shifter, fail-safe, gated S1L60000 series MP
Semiconductor ASIC gate array-Part Number-S1L50000

S1L50000

Available upon quote Tpd=0.38ns (at 5.0V, F/O=2, standard wiring load) Level shifter, 0.4ns (at 3.3V, F/O=2, standard wiring load), 1.3ns (at 2.0V, F/O= 2, standard wiring load) Tpd=2.12ns (at 5.0V) Level shifter, 2.02ns (at 3.3V), 3.9ns (at 2.0V), CL=15pF Tpd=0.14ns (at 3.3V, F/O=2, standard wiring load), 0.21ns (at 2.0V, F/O=2, standard wiring load) Highly integrated (0.35µm CMOS 2-layer/3-layer/4-layer wiring process adopted), high-speed operation (internal gate delay 0.14ns at 3.3V 2-input Power-NAND Typ.), etc. CMOS, LVTTL, PCI-5V, PCI-3.3V LVTTL, CMOS, pullup/pulldown, Schmitt, Fail-safe, Gated Normal, open-drain, 3-state, bidirectional, fail-safe, gated S1L50000 series MP
Semiconductor ASIC gate array-Part Number-S1L5V000

S1L5V000

Available upon quote Tpd=0.45ns (at 5.0V, F/O=2, standard wiring load), tpd=0.55ns (at 3.3V, F/O=2, standard wiring load) Tpd=2.07ns (at 5.0V), tpd=2.95ns (at 3.3V), CL=15pF Tpd=0.19ns (at 5.0V, F/O=2, standard wiring load), tpd=0.29ns (at 3.3V, F/O=2, standard wiring load) Highly integrated (0.35µm CMOS 2-layer/3-layer/4-layer wiring process adopted), high-speed operation (internal gate delay: 0.19ns at 5.0V, 0.29ns at 3.3V, 2-input Power-NAND Typ.), etc. CMOS, TTL, LVTTL TTL, LVTTL, CMOS, pull-up/pull-down, Schmitt, Fail-safe, Gated Normal, open-drain, 3-state, bidirectional, fail-safe, gated S1L5V000 series MP

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