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■High-end white light interference microscope A high-performance white light interference microscope that supports 64 bits. Improved operability, extensive data reporting functions, data stitching measurement of over 2,000 sheets, film thickness measurement, objective lens lineup that allows measurement in heating and cooling environments, etc., for a variety of applications ranging from research and development to production management. We provide high-precision, non-contact 3D shape information that answers your questions at high speed.
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Contour GT-XHandling Company
Bruker CorporationCategories
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