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■General purpose AFM (atomic force microscope) Although it is small, this AFM is packed with many functions and has excellent cost performance. In addition to general AFM scanning technology, it is also equipped with the latest technologies such as dark lift (effective when evaluating electrical characteristics) and a scanner with a 3-axis sensor. Integrated optical microscope and soundproof hood. Also compatible with TERS
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See all 3 models in listPart Number
InnovaHandling Company
Bruker CorporationCategories
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