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Atomic force microscope (material AFM) large platform Dimension series-Bruker Corporation

Dimension Icon | Atomic force microscope (material AFM) large platform Dimension series
Bruker Corporation

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■Standard model High performance AFM for large samples Dimension Icon This AFM (atomic force microscope) far exceeds conventional products, meeting all needs for large sample measurement, high resolution, operability, multi-function, and scalability. Equipped with a closed-loop scanner with ultra-low noise and low drift. Furthermore, it is a revolutionary AFM that can be equipped with the ScanAsyst function that enables one-push operation using the new PeakForce Tapping technology, and the PeakForce QNM quantitative mechanical property mapping function.

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About Company Handling This Product

Bruker Corporation

Response Rate

100.0%

Response Time

24.5hrs

Company Overview

Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific...

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