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  5. Dimension HPI
Atomic force microscope (material AFM) large platform Dimension series-Bruker Corporation

Dimension HPI | Atomic force microscope (material AFM) large platform Dimension series
Bruker Corporation

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Model Description

■AFM Dimension HPI for industry The Dimension® family of atomic force microscopes (AFM) has a long history of excellence in industrial metrology applications due to its highest speed and performance. Specifically designed for high-volume production environments, Dimension HPI and PRO systems enable automated measurements of many AFM modes while providing maximum ease of use and operational flexibility for quality control, quality assurance, and failure analysis. Using contact, tapping, and PeakForceTapping® mode technology, users precisely control the interaction between probe and sample, providing long tip life and accurate results even over thousands of repeated measurements.

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About Company Handling This Product

Bruker Corporation

Response Rate

100.0%

Response Time

24.5hrs

Company Overview

Bruker, founded in 1960 and based in Billerica, Massachusetts, is a manufacturer and distributor of scientific...

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