8 products found
Tokyo Instruments, Inc
20+ people viewing
Last viewed: 1 day ago
100.0% Response Rate
66.2hours Response Time
■Summary "Envio METROS" is an epoch-making product that breaks the conventional wisdom of X-ray photoelectron spectrometers. By changing the pressu...
Tokyo Instruments, Inc
30+ people viewing
Last viewed: 10 hours ago
100.0% Response Rate
66.2hours Response Time
■Features ・Control sample environment from low vacuum to high vacuum ・Can measure everything from solids to solutions and biological samples ・La...
Tokyo Instruments, Inc
20+ people viewing
Last viewed: 13 hours ago
100.0% Response Rate
66.2hours Response Time
■Product overview This system is a device that measures nanosecond to millisecond order transient absorption spectra and fluorescence spectra of sa...
Tokyo Instruments, Inc
20+ people viewing
Last viewed: 32 minutes ago
100.0% Response Rate
66.2hours Response Time
■High-sensitivity double pulse LIBS overview The LEA-S500 high-sensitivity double-pulse LIBS is a laser-induced plasma spectrometer developed for e...
Tokyo Instruments, Inc
20+ people viewing
100.0% Response Rate
66.2hours Response Time
■Product overview Laser-induced fluorescence is a highly sensitive diagnostic method that uses light excitation processes and plasma excitation pro...
Tokyo Instruments, Inc
20+ people viewing
Last viewed: 18 hours ago
100.0% Response Rate
66.2hours Response Time
■Summary This device, the "Operando KP*-PYS** Material Analysis System," is the world's first product that "realizes energy level measurement under...
Tokyo Instruments, Inc
30+ people viewing
Last viewed: 20 hours ago
100.0% Response Rate
66.2hours Response Time
■Multi-functional expandable LIBS device Sci-Trace ・Modular design with extensive expandability and selection, atmosphere control (depressurized/p...
Tokyo Instruments, Inc
20+ people viewing
Last viewed: 22 hours ago
100.0% Response Rate
66.2hours Response Time
■SFG (sum frequency generation) spectroscopy system ・Non-destructive, non-contact molecular vibration analysis of surfaces and interfaces (solid-l...