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  4. Tokyo Instruments, Inc

Tokyo Instruments, Inc's Spectroscopic Analyzer

Tokyo Instruments, Inc

8 products found

8-inch, 12-inch semiconductor wafer analysis X-ray photoelectron spectrometer Enviro METROS series-Tokyo Instruments, Inc

Tokyo Instruments, Inc

8-inch, 12-inch semiconductor wafer analysis X-ray photoelectron spectrometer Enviro METROS series

140+ people viewing

Last viewed: 5 hours ago

Standard Response

Response Rate
100.0 %
Response Time
23.2 hours

■Summary "Envio METROS" is an epoch-making product that breaks the conventional wisdom of X-ray photoelectron spectrometers. By changing the pressu...


Environmental control X-ray photoelectron spectrometer EnviroESCA-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Environmental control X-ray photoelectron spectrometer EnviroESCA

120+ people viewing

Last viewed: 15 hours ago

Standard Response

Response Rate
100.0 %
Response Time
23.2 hours

■Features ・Control sample environment from low vacuum to high vacuum ・Can measure everything from solids to solutions and biological samples ・La...


Spectroscopic measurement Nanosecond to millisecond transient absorption measurement system Laser flash photolysis-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Spectroscopic measurement Nanosecond to millisecond transient absorption measurement system Laser flash photolysis

120+ people viewing

Last viewed: 16 hours ago

Standard Response

Response Rate
100.0 %
Response Time
23.2 hours

■Product overview This system is a device that measures nanosecond to millisecond order transient absorption spectra and fluorescence spectra of sa...


Spectroscopic measurement High-sensitivity laser-induced plasma spectrometer with sub-ppm detection limit High-sensitivity double pulse LIBS-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Spectroscopic measurement High-sensitivity laser-induced plasma spectrometer with sub-ppm detection limit High-sensitivity double pulse LIBS

120+ people viewing

Last viewed: 20 hours ago

Standard Response

Response Rate
100.0 %
Response Time
23.2 hours

■High-sensitivity double pulse LIBS overview The LEA-S500 high-sensitivity double-pulse LIBS is a laser-induced plasma spectrometer developed for e...


Spectroscopic measurement Highly sensitive analysis system for combustion and plasma analysis LIF (laser induced fluorescence) analysis system-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Spectroscopic measurement Highly sensitive analysis system for combustion and plasma analysis LIF (laser induced fluorescence) analysis system

130+ people viewing

Last viewed: 6 hours ago

Standard Response

Response Rate
100.0 %
Response Time
23.2 hours

■Product overview Laser-induced fluorescence is a highly sensitive diagnostic method that uses light excitation processes and plasma excitation pro...


Introducing an innovative tool for operando analysis of electronic device materials Achieves energy level measurement under actual operation Operando KP-PYS material analysis system-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Introducing an innovative tool for operando analysis of electronic device materials Achieves energy level measurement under actual operation Operando KP-PYS material analysis system

80+ people viewing

Last viewed: 1 hour ago

Standard Response

Response Rate
100.0 %
Response Time
23.2 hours

■Summary This device, the "Operando KP*-PYS** Material Analysis System," is the world's first product that "realizes energy level measurement under...


Spectroscopic measurement multi-functional expanded LIBS device Sci-Trace-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Spectroscopic measurement multi-functional expanded LIBS device Sci-Trace

100+ people viewing

Last viewed: 1 hour ago

Standard Response

Response Rate
100.0 %
Response Time
23.2 hours

■Multi-functional expandable LIBS device Sci-Trace ・Modular design with extensive expandability and selection, atmosphere control (depressurized/p...


Spectroscopic measurement SFG (sum frequency generation) spectroscopic system-Tokyo Instruments, Inc

Tokyo Instruments, Inc

Spectroscopic measurement SFG (sum frequency generation) spectroscopic system

130+ people viewing

Last viewed: 5 hours ago

Standard Response

Response Rate
100.0 %
Response Time
23.2 hours

■SFG (sum frequency generation) spectroscopy system ・Non-destructive, non-contact molecular vibration analysis of surfaces and interfaces (solid-l...



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