All Categories

History

  1. Metoree
  2. Observation Equipment
  3. Scanning Probe Microscopes
  4. Time-resolved scanning tunneling microscope system Ultra-high vacuum time-resolved multi-probe microscope USM1400-4P-OPP (Unisoku Co., Ltd.)
Time-resolved scanning tunneling microscope system Ultra-high vacuum time-resolved multi-probe microscope USM1400-4P-OPP-USM1400-4P-OPP
Time-resolved scanning tunneling microscope system Ultra-high vacuum time-resolved multi-probe microscope USM1400-4P-OPP-Unisoku Co., Ltd.

Time-resolved scanning tunneling microscope system Ultra-high vacuum time-resolved multi-probe microscope USM1400-4P-OPP
Unisoku Co., Ltd.

Unisoku Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

51.7hours

About This Product

Observation of ultrafast dynamics measurements of photoexcitation phenomena at the nanoscale.

■Principle of time-resolved STM

The sample is irradiated with pump light and probe light, and the tunneling current flowing between the sample and the probe is measured. When the delay time is short (long), the excited state is occupied (not occupied) by carriers, so the number of carriers excited by the probe light is small (large). As a result, the tunneling current becomes smaller (larger). By measuring the delay time dependence of tunneling current, information on carrier dynamics (such as relaxation time) can be obtained. Furthermore, by changing the tip position, carrier dynamics measurements can be performed with nanoscale spatial resolution.

■Unique delay time modulation method

In order to suppress the probe thermal expansion effect caused by excitation light irradiation and to detect minute time-resolved tunneling current signals with high precision, delay time modulation measurement that changes the delay time in a rectangular waveform is effective. known (patented technology). This device is equipped with a delay time modulation system that is ideal for time-resolved STM measurements and a lock-in amplifier that detects tunneling current in synchronization with the modulation. You can start measuring.

■Lineup

・Low temperature-ultra high vacuum time-resolved STM system USM1400-OPP ・Ultra-high vacuum time-resolved multi-probe microscope USM1400-4P-OPP ・Ultra-high vacuum low temperature scanning probe microscope system USM1200 ・Liquid helium-free ultra-high vacuum low temperature scanning tunneling microscope system USM1800 Features

■Compact excitation light source unit

・Temporal resolution ~70ps - Significantly improved operability ・Long-term stable laser irradiation onto the sample surface ・Wavelength is 532nm ・Nanosecond laser can also be selected

■Carrier dynamics measurement of sample on insulator substrate

・Specimen and probe observation using a long focus microscope ・Independent control of 4 probes ・Gate voltage can be applied

■Application fields of time-resolved multi-probe microscopy

・Carrier dynamics measurement of single-layer TMDC heterostructure ・Exciton dynamics measurement of single-layer TMDC nanostructures ・Measurement of trap level dynamics of single-layer TMDC

  • Product

    Time-resolved scanning tunneling microscope system Ultra-high vacuum time-resolved multi-probe microscope USM1400-4P-OPP

Share this product


60+ people viewing

Last viewed: 4 hours ago

Free
Get started with our free quotation service - no cost, no obligation.

No Phone Required
We respect your privacy. You can receive quotes without sharing your phone number.

1 Models of Time-resolved scanning tunneling microscope system Ultra-high vacuum time-resolved multi-probe microscope USM1400-4P-OPP

Image Part Number Price (excluding tax) Sample stage movement range Degree of vacuum Measurement temperature Number of probes Probe stage movement range (sample horizontal direction) Light incidence angle Lens stage movement distance Lens STM scan range
Time-resolved scanning tunneling microscope system Ultra-high vacuum time-resolved multi-probe microscope USM1400-4P-OPP-Part Number-USM1400-4P-OPP

USM1400-4P-OPP

Available upon quote

X, Y: ±2 mm

Ultra high vacuum

Room temperature (low temperature support optional)

4

X. Z: ±2 mm, Y: ±4 mm

Perpendicular to the sample surface

X. -12 mm~+1.5 mm
Y: ±2 mm
Z: ±2 mm

Aspheric lens (NA: 0.3)

2um×2um

Customers who viewed this product also viewed

Reviews shown here are reviews of companies.

Atomic force microscope (material AFM) large platform Dimension series-Bruker Corporation

Atomic force microscope (material AFM) large platform Dimension series

Bruker Corporation

350+ people viewing

Last viewed: 2 hours ago

Response time: 23.31 hours

Scanning Probe Microscopes

24 models listed

Ultra-high vacuum cryogenic scanning probe microscope system USM1200-Unisoku Co., Ltd.

Ultra-high vacuum cryogenic scanning probe microscope system USM1200

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Scanning Probe Microscope Ultra High Vacuum Cryogenic High Magnetic Field Scanning Tunneling Microscope System USM1300-Unisoku Co., Ltd.

Scanning Probe Microscope Ultra High Vacuum Cryogenic High Magnetic Field Scanning Tunneling Microscope System USM1300

Unisoku Co., Ltd.

70+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Ultra-high vacuum cryogenic scanning probe microscope system USM1400-Unisoku Co., Ltd.

Ultra-high vacuum cryogenic scanning probe microscope system USM1400

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Ultra-high vacuum low temperature strong magnetic field scanning probe microscope USM1500-Unisoku Co., Ltd.

Ultra-high vacuum low temperature strong magnetic field scanning probe microscope USM1500

Unisoku Co., Ltd.

50+ people viewing

Last viewed: 12 minutes ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Scanning Probe Microscope Dilution Refrigeration Ultra High Vacuum Ultra Low Temperature Strong Magnetic Field Scanning Tunneling Microscope System USM1600-Unisoku Co., Ltd.

Scanning Probe Microscope Dilution Refrigeration Ultra High Vacuum Ultra Low Temperature Strong Magnetic Field Scanning Tunneling Microscope System USM1600

Unisoku Co., Ltd.

40+ people viewing

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P-Unisoku Co., Ltd.

Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P

Unisoku Co., Ltd.

50+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Scanning Probe Microscope Ultra High Vacuum Low Temperature SPM/Raman Microscope System USM1400-LT TERS-Unisoku Co., Ltd.

Scanning Probe Microscope Ultra High Vacuum Low Temperature SPM/Raman Microscope System USM1400-LT TERS

Unisoku Co., Ltd.

70+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Scanning probe microscope Liquid helium-free ultra-high vacuum low temperature scanning tunneling microscope system USM1800-Unisoku Co., Ltd.

Scanning probe microscope Liquid helium-free ultra-high vacuum low temperature scanning tunneling microscope system USM1800

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)-Mysec Co., Ltd.

Measurement and analysis equipment Analyzer equipment Scanning probe microscope Atomic force microscope (AFM/SPM)

Mysec Co., Ltd.

40+ people viewing

Last viewed: 2 minutes ago

Response time: 22.63 hours

Scanning Probe Microscopes

2 models listed

Cypher AFM/SPM family of atomic force microscopes offers scan speeds comparable to video rates-Oxford Instruments Ltd.

Cypher AFM/SPM family of atomic force microscopes offers scan speeds comparable to video rates

Oxford Instruments Ltd.

310+ people viewing

Last viewed: 36 minutes ago

Response time: 26.30 hours

Scanning Probe Microscopes

8 models listed

AFM Jupiter XR Atomic Force Microscope (AFM/SPM) with excellent basic performance-Oxford Instruments Ltd.

AFM Jupiter XR Atomic Force Microscope (AFM/SPM) with excellent basic performance

Oxford Instruments Ltd.

220+ people viewing

Response time: 26.30 hours

Scanning Probe Microscopes

2 models listed

See More Scanning Probe Microscopes Products

Other products of Unisoku Co., Ltd.

Reviews shown here are reviews of companies.

Ultra-high vacuum cryogenic scanning probe microscope system USM1200-Unisoku Co., Ltd.

Ultra-high vacuum cryogenic scanning probe microscope system USM1200

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Scanning Probe Microscope Ultra High Vacuum Cryogenic High Magnetic Field Scanning Tunneling Microscope System USM1300-Unisoku Co., Ltd.

Scanning Probe Microscope Ultra High Vacuum Cryogenic High Magnetic Field Scanning Tunneling Microscope System USM1300

Unisoku Co., Ltd.

70+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Ultra-high vacuum cryogenic scanning probe microscope system USM1400-Unisoku Co., Ltd.

Ultra-high vacuum cryogenic scanning probe microscope system USM1400

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Ultra-high vacuum low temperature strong magnetic field scanning probe microscope USM1500-Unisoku Co., Ltd.

Ultra-high vacuum low temperature strong magnetic field scanning probe microscope USM1500

Unisoku Co., Ltd.

50+ people viewing

Last viewed: 12 minutes ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Scanning Probe Microscope Dilution Refrigeration Ultra High Vacuum Ultra Low Temperature Strong Magnetic Field Scanning Tunneling Microscope System USM1600-Unisoku Co., Ltd.

Scanning Probe Microscope Dilution Refrigeration Ultra High Vacuum Ultra Low Temperature Strong Magnetic Field Scanning Tunneling Microscope System USM1600

Unisoku Co., Ltd.

40+ people viewing

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P-Unisoku Co., Ltd.

Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P

Unisoku Co., Ltd.

50+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Scanning Probe Microscope Ultra High Vacuum Low Temperature SPM/Raman Microscope System USM1400-LT TERS-Unisoku Co., Ltd.

Scanning Probe Microscope Ultra High Vacuum Low Temperature SPM/Raman Microscope System USM1400-LT TERS

Unisoku Co., Ltd.

70+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

Scanning probe microscope Liquid helium-free ultra-high vacuum low temperature scanning tunneling microscope system USM1800-Unisoku Co., Ltd.

Scanning probe microscope Liquid helium-free ultra-high vacuum low temperature scanning tunneling microscope system USM1800

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 4 hours ago

Response time: 51.68 hours

Scanning Probe Microscopes

2 models listed

SPM Controller Stage Controller Unisurface SPC-STG-Unisoku Co., Ltd.

SPM Controller Stage Controller Unisurface SPC-STG

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 2 hours ago

Response time: 51.68 hours

Power Control Units
SPM controller Nanonis™ High precision and high functionality SPM controller Mimea BP5e-Unisoku Co., Ltd.

SPM controller Nanonis™ High precision and high functionality SPM controller Mimea BP5e

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 1 hour ago

Response time: 51.68 hours

Power Control Units
SPM unit product 2kV sputter ion gun IB-201-Unisoku Co., Ltd.

SPM unit product 2kV sputter ion gun IB-201

Unisoku Co., Ltd.

60+ people viewing

Response time: 51.68 hours

Cryostat for spectroscopy CoolSpeK USP-203IR for infrared spectroscopy-Unisoku Co., Ltd.

Cryostat for spectroscopy CoolSpeK USP-203IR for infrared spectroscopy

Unisoku Co., Ltd.

60+ people viewing

Last viewed: 2 hours ago

Response time: 51.68 hours

Cryostats

2 models listed


View more products of Unisoku Co., Ltd.

About Company Handling This Product

Unisoku Co., Ltd.

Response Rate

100.0%

Response Time

51.7hrs

  • Japan

Related search keywords

Scanning Probe Microscopes
Scanning Probe Microscopes　Unisoku Co., Ltd.
Unisoku Co., Ltd.

This is the version of our website addressed to speakers of English in the United States. If you are a resident of another country, please select the appropriate version of Metoree for your country in the drop-down menu.

Copyright © 2024 Metoree