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  2. SPM unit product EBT-100 (Unisoku Co., Ltd.)
SPM unit product EBT-100-EBT-100
SPM unit product EBT-100-Unisoku Co., Ltd.

SPM unit product EBT-100
Unisoku Co., Ltd.

About This Product

This device is designed to clean the tip of the probe by heating it with an electron beam so that clearer scanning tunneling microscopy (STM) images can be measured.The device focuses the electrons emitted from the tungsten filament onto the tip. It can be irradiated by This is especially effective when measuring ultra-high vacuum STM using air-oxidized probes.

■Features

・Easy to operate, lightweight, compact ・Intensive heating of the probe tip in ultra-high vacuum ・Dramatically improved data for ultra-high vacuum STM measurements

■Applications

Cleaning the tip of the electron beam STM probe by heating it in an ultra-high vacuum

■Configuration

・1 unit head ・Power supply unit 1 unit ・Remote controller (EBR-100) 1 unit ・1 set of dedicated cable ・Replacement filament (U200-1030) 1 piece (spare) ・Instruction manual 1 set

  • Product

    SPM unit product EBT-100

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1 Models of SPM unit product EBT-100

Image Part Number Price (excluding tax) Power weight Body weight Outer diameter Ø Operating environment Acceleration voltage Total length (shortest time) Filament current Filament voltage Filament Stroke Emission current
SPM unit product EBT-100-Part Number-EBT-100

EBT-100

Available upon quote

＜5Kg

＜3Kg

70mm

1×10 - 8 Torr or less

0 ~ -1.5 kV variable

337.8mm (can be changed to optimal size)

Max 3.0A variable

Maximum 12V variable

Tungsten

46mm (adjustable to optimal distance)

Maximum 5.9 mA variable

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About Company Handling This Product

Unisoku Co., Ltd.

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