Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P
Unisoku Co., Ltd.
About This Product
The most versatile and high-performance multi-probe SPM system on the market, it is a cutting-edge tool for nanotechnology research. This is the world's first, state-of-the-art multi-point probe microscope system developed with all the efforts of Unisoku, commissioned by the JST Advanced Measurement Development Project. It is used for measuring micro- and nanoscale surface electrical conductivity and evaluating nanodevices in a wide temperature range from low temperatures by scanning the probe microscope independently with 4 probes.
High resolution is achieved using a uniquely developed multifunctional probe, enabling a wide range of applied measurements.
■Features
・Nanoscale positioning is possible using an electron microscope
・Each STM/AFM function is possible with an independent probe
・4-terminal electrical conductivity measurement possible at nanoscale
・Vacuum chamber equipment for ultra-high vacuum MBE
・Easy to perform light irradiation, luminescence measurement, high frequency measurement, etc.
・Incorporates superconducting coil (optional) and applies to Hall effect and spin measurement
■Applications
・Micro and nanoscale 4-terminal resistance measurement of conductive thin films
・Measurement of conductive properties of nanostructures and nanodots
・Temperature-variable conductivity measurement of organic conductive films and semiconductors
・Analysis of local electrical properties of nanodevices
・Temperature variable STM imaging
・Can be widely applied to other surface analysis
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Product
Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P
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Handling Company
Unisoku Co., Ltd.
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Categories
1 Models of Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P
| Product Image | Part Number | Price (excluding tax) | 4-probe STM head maximum scan range | 4-probe STM head minimum resolution (STM) | 4-probe STM head sample and probe stage | FE-SEM minimum resolution |
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USM1400-4P |
Available upon quote | 0.38 × 0.38 × 0.38 μm3 @ 5K (X×Y×Z) | X, Y: 0.1 nm (atomic resolution); Z: 0.02 nm or less | Maximum drive range X, Y: 5 mm; Z: 3 mm | Up to 20 nm (when accelerating voltage setting is 25 kV, WD 15 mm, probe current 1 nA) Maximum field of view 3 mm x 3 mm (when accelerating voltage is 5 kV) |
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About Company Handling This Product
- Japan