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  4. Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P (Unisoku Co., Ltd.)
Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P-USM1400-4P
Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P-Unisoku Co., Ltd.

Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P
Unisoku Co., Ltd.

Unisoku Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

28.1hours

Relatively Fast Response

About This Product

The most versatile and high-performance multi-probe SPM system on the market, it is a cutting-edge tool for nanotechnology research. This is the world's first, state-of-the-art multi-point probe microscope system developed with all the efforts of Unisoku, commissioned by the JST Advanced Measurement Development Project. It is used for measuring micro- and nanoscale surface electrical conductivity and evaluating nanodevices in a wide temperature range from low temperatures by scanning the probe microscope independently with 4 probes. High resolution is achieved using a uniquely developed multifunctional probe, enabling a wide range of applied measurements.

■Features

・Nanoscale positioning is possible using an electron microscope ・Each STM/AFM function is possible with an independent probe ・4-terminal electrical conductivity measurement possible at nanoscale ・Vacuum chamber equipment for ultra-high vacuum MBE ・Easy to perform light irradiation, luminescence measurement, high frequency measurement, etc. ・Incorporates superconducting coil (optional) and applies to Hall effect and spin measurement

■Applications

・Micro and nanoscale 4-terminal resistance measurement of conductive thin films ・Measurement of conductive properties of nanostructures and nanodots ・Temperature-variable conductivity measurement of organic conductive films and semiconductors ・Analysis of local electrical properties of nanodevices ・Temperature variable STM imaging ・Can be widely applied to other surface analysis

  • Product

    Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P

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1 Models of Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P

Image Part Number Price (excluding tax) FE-SEM minimum resolution 4-probe STM head sample and probe stage 4-probe STM head minimum resolution (STM) 4-probe STM head maximum scan range
Ultra-high vacuum low temperature 4-point scanning probe microscope system USM1400-4P-Part Number-USM1400-4P

USM1400-4P

Available upon quote

Up to 20 nm (when accelerating voltage setting is 25 kV, WD 15 mm, probe current 1 nA) Maximum field of view 3 mm x 3 mm (when accelerating voltage is 5 kV)

Maximum drive range X, Y: 5 mm; Z: 3 mm

X, Y: 0.1 nm (atomic resolution); Z: 0.02 nm or less

0.38 × 0.38 × 0.38 μm3 @ 5K (X×Y×Z)

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About Company Handling This Product

Unisoku Co., Ltd.

Response Rate

100.0%

Response Time

28.1hrs

  • Japan

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