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Organic EL life measurement system ELLT1001-ELLT1001
Organic EL life measurement system ELLT1001-Precise Gauge Co., Ltd.

Organic EL life measurement system ELLT1001
Precise Gauge Co., Ltd.


About This Product

The organic EL lifespan measurement system ELLT1001 is a system that tests the lifespan of organic EL elements by measuring the luminescence characteristics of organic EL elements at arbitrary time intervals over a long period of time under a constant temperature environment. It is possible to set driving conditions and temperature conditions individually and test up to 32 elements at the same time. By using a CCD camera on the detector side, it is possible to measure not only changes in brightness, but also spatial changes in brightness unevenness and changes in dark spots. By reducing photolysis (optional), it is also possible to measure spectral changes. The system is centrally controlled by an external PC, so once the elements are set, lifespan inspections can be performed in a fully automatic manner over several days to several weeks.

■Measurement items

・Change in relative brightness over time (numerical values, graphs) ・Current change over time (numerical values, graphs) ・Voltage change over time (numerical values, graphs) ・Brightness unevenness changes (numbers, profiles, images, graphs) ・Dark spot changes (values ​​(area, number), profiles, images, graphs)

■Features of the device

・Temperature control enables lifespan measurement under a constant temperature environment - Simultaneous measurement of up to 32 elements with independent drive settings possible ・Measurement using a camera allows measurement of not only brightness but also brightness unevenness, dark spot changes, etc. ・Fully automatic long-term measurement by external computer control ・Spectrum changes can be measured simultaneously using the spectrometer option. *Also compatible with color cameras, high-resolution digital cameras, etc.

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    Organic EL life measurement system ELLT1001

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1 Models of Organic EL life measurement system ELLT1001

Image Part Number Price (excluding tax) Driving initial conditions Voltage/current generator constant current drive Voltage/current generator Constant voltage drive Voltage/current generator output Exam time Sample stage Electrical connection with materials Sample stage Installable substrate size Sample stage temperature setting range Measuring field of view Measurement end conditions Measurement time Measurement brightness range Temperature setting range Injection current setting range Wavelength characteristic measurement (optional) Detector light receiving area Detector number of pixels Detector pixel size Detector camera Applied voltage setting range Optical system reading resolution Optical system field of view (when using 1/2 inch CCD camera) Optical system magnification Optical system working distance Data acquisition time Software printing Software control Software General Functions Software data display Software data storage
Organic EL life measurement system ELLT1001-Part Number-ELLT1001

ELLT1001

$ 32,500.00〜

Voltage, current, and relative brightness settings for each element independently

Drive voltage/setting resolution: 0.0mA~200.0mA/100μA, 0.00mA~20.00mA/10μA, 0.000mA~2.000mA/1μA
Voltage measurement range: 0.00V~38.00V/10mV

Drive voltage/setting resolution: 0.00V~38.00V/10mV
Current measurement range: 0.0mA~200.0mA/100μA

Maximum 32ch

Over 20,000 hours within the maximum number of measurement points
Minimum number of measurement points is 60,000 or more

Has 4 types of electrical contacts using contact pins

Maximum 100mm x 100mm

20℃~90℃ (accuracy ±1℃)
(When using temperature control element stage)

12.8mm or 6.4mm (when using telecentric optics)
8.5mm~50mm or 1.4mm~8.4mm (when using zoom optical system)

Automatically set by relative brightness, measurement voltage, and current settings for each element independently.

Measurement time per element within 10 seconds (2D image, relative brightness, current/voltage)
Any time interval of 10 seconds or more, independently for each element
Set the time interval arbitrarily in 4 or more steps

1~10,000cd/m² or more (resolution 1cd/m²)

20°C~90°C (accuracy ±1°C)
(When using temperature controlled precision stage)

0mA~200mA (Resolution 1µA~100µA)

Wavelength range: 380nm~780nm, resolution: 2nm

6.5mm×4.8mm

768×494

8.4μm×9.8μm

1/2 inch analog black and white CCD camera

0V~38V (Resolution 10mV)

Telecentric: approx. 20μm, approx. 10μm
Zoom optical system: approx. 13μm ~ approx. 77μm, approx. 2μm ~ approx. 13μm

Telecentric: 12.8mm, 6.4mm
Zoom optical system: 8.5mm~50mm, 1.4mm~8.4mm

Telecentric: ×0.5, ×1
Zoom optical system: ×0.75~×0.13, ×4.36~×0.77

Telecentric: 117mm~142mm, 98mm~123mm
Zoom optical system: 25mm~170mm, fixed at 95mm

Within 10 seconds per element (2D image, relative brightness, current/voltage)

Printing the display screen

Parameter setting, image acquisition, XY stage control, data analysis

Complete recording of each light emitting characteristic and 2D image of the light emitting surface
Create a two-dimensional graph of changes over time in each luminescence characteristic and output to a file in CSV format.
Analyze and graph changes over time (dark spots, uneven brightness) in 2D images

Acquired images, graph display of changes over time, 1D-, 2D-, and 3D-profile display of images

Image data, analytical numerical data

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