Crystal device manufacturing Temperature test TCXO temperature test equipment PTTA-T16X
PFA Co., Ltd.
About This Product
■Summary
・A device that measures the temperature characteristics of a TCXO (temperature compensated crystal oscillator) and writes adjustment data to the IC.
・This is a high-speed device that achieves takt time: 0.85sec.
■Features
- Temperature control using the Peltier temperature control plate enables uniform temperature distribution over a wide range of temperatures from the low temperature side (-40℃) to the high temperature side (120℃), making it possible to produce highly accurate products.
・Workpieces are supplied and arranged on dedicated carriers, and the carriers are shuttled onto the temperature plate.
- Peltier temperature control on the measuring head side also reduces temperature changes during probe contact.
・The standard temperature chamber is 16, but it is possible to increase the number of temperature chambers. (Please consult separately)
・Significantly more compact than the conventional thermostat in-line type.
■Usage example
・A device that measures the temperature characteristics of a TCXO (temperature compensated crystal oscillator) and writes adjustment data to the IC.
- Temperature control using the Peltier temperature control plate enables uniform temperature distribution over a wide range of temperatures from the low temperature side (-40℃) to the high temperature side (120℃), making it possible to produce highly accurate products.
・Because the dedicated carrier is directly cooled and heated on the temperature control plate, SoakTime is not required and the takt time is fast.
・This is a high-speed device that achieves takt time: 0.85sec.
・Workpieces are supplied and arranged on dedicated carriers, and the carriers are shuttled onto the temperature plate.
・Dedicated carrier: Approximately 300 sheets are operated in automatic cycle operation within the device.
- Peltier temperature control on the measuring head side reduces heat loss when the stylus contacts.
・The standard temperature chamber is 16, but it is possible to increase the number of temperature chambers. (Please consult separately)
*Please note that the appearance and specifications may be partially changed in order to improve performance.
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Product
Crystal device manufacturing Temperature test TCXO temperature test equipment PTTA-T16X
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Handling Company
PFA Co., Ltd.
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Categories
1 Models of Crystal device manufacturing Temperature test TCXO temperature test equipment PTTA-T16X
| Product Image | Part Number | Price (excluding tax) | Carrier transport | Drive source | Equipment dimensions and mass | Equipment tact | Measuring head | Target work | Target work size | Temperature control | Temperature range | Work carrier |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
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PTTA-T16X |
Available upon quote | Shuttle transport over temperature controlled stage |
Input power 3 phase 200V 150A planned Power consumption 48kVA air 0.5MPa 550N liter/min clean air |
L3,500×W2,000×H1,700 4,000kg planned | 0.85sec | With Peltier temperature control | TCXO (temperature compensated crystal oscillator) |
1,612~3,225 (standard size) *Depends on the size, position, and shape of the terminal *Non-standard sizes also available (separate consultation) |
Peltier method (chiller is used for Peltier control) | ₋40℃~+120℃ |
Aluminum plate carrier (120mm x 15mm x 2mm) Number of workpieces loaded on one carrier: 64 (3,225 or less) Approximately 300 carriers are used for one device and one type. |
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About Company Handling This Product
- Japan