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  4. Crystal device manufacturing temperature test DIP inspection temperature test device PTT-300 (PFA Co., Ltd.)
Crystal device manufacturing temperature test DIP inspection temperature test device PTT-300-PTT-300
Crystal device manufacturing temperature test DIP inspection temperature test device PTT-300-PFA Co., Ltd.

Crystal device manufacturing temperature test DIP inspection temperature test device PTT-300
PFA Co., Ltd.

PFA Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

92.9hours

About This Product

■Summary

This is a device that inspects the temperature characteristics of SMD type crystal oscillators. DIP (dip) testing of temperature characteristics is possible by continuously changing the temperature in the range from -30℃ to +85℃.

■Features

-This device uses a Peltier element for temperature control, and by placing an SMD crystal oscillator on a plate whose temperature is controlled by the Peltier element, highly accurate temperature characteristic tests are possible. In addition, by controlling the temperature in the range of -30 to +85°C in 0.5°C temperature steps, DIP inspection of accurate temperature characteristics is possible. ・Achieves high throughput by measuring multiple units simultaneously. ・The loader and unloader perform everything automatically from supply to sorting and storage. ・This temperature inspection device is ideal for development, quality assurance, prototyping, and small-lot production.

■Usage example

・This is a device that inspects the temperature characteristics of SMD type crystal oscillators. ・DIP (dip) inspection of temperature characteristics is possible by continuously changing the temperature in the range from -30℃ to +85℃.

■Optional support

・Temperature characteristics inspection of SMD type crystal resonator ・Supports multiple types by replacing dedicated jigs *Please note that the appearance and specifications may be partially changed in order to improve performance.

  • Product

    Crystal device manufacturing temperature test DIP inspection temperature test device PTT-300

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1 Models of Crystal device manufacturing temperature test DIP inspection temperature test device PTT-300

Image Part Number Price (excluding tax) Stylus block Measuring instrument Temperature control time (approximate) Temperature control method Temperature control plate Temperature range Target work size Target work External dimensions Work supply Option
Crystal device manufacturing temperature test DIP inspection temperature test device PTT-300-Part Number-PTT-300

PTT-300

Available upon quote

Probe type: 2 sets (temperature control plate 1, temperature control plate 2: 1 set each)

Frequency counter + power supply

+25℃⇒-30℃: Approx. 5 minutes, -30℃⇒+85℃: Approx. 10 minutes, +85℃⇒+25℃: Approx. 5 minutes

Peltier element + chiller unit

Dedicated tray with approximately 80 pieces

-30℃~+85℃ *Temperature range is negotiable

5.0×3.2~1.6×1.2 (mm) *Work size is negotiable

SMD type crystal oscillator *SMD type crystal oscillator also available as an option

Main body: W1,200 x D800 x H1,500mm (excluding protrusions such as measuring instruments and patrol lights)
Chiller: W340 x D384 x H851mm x 4 types (for temperature control plate)

Supplied from stacked trays and transferred to temperature control plate (dedicated tray)

Compatible with SMD type crystal resonators, compatible with multiple sizes of products using switching parts

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About Company Handling This Product

PFA Co., Ltd.

Response Rate

100.0%

Response Time

92.9hrs

  • Japan

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