Bitmap inspection device
Micro Technica Co., Ltd.
About This Product
■High-speed color printing density, dirt, and other defects can be extracted.
Bitmap inspection equipment performs ``verification inspection of full variable printing using variable data for printing as correct data.'' Instead of testing by registering non-defective products as masters, we use variable data as correct data, so it is possible to cross-check all pages with variable printing.
■Product features
・Variable pattern inspection based on printing data
・By using RIP software (software from Text & Graphic Co., Ltd.), variable pattern inspection can be performed offline.
・Variable pattern inspection at 300DPI
・At the same time as pattern inspection, OCR/BC/QR code readability inspection and front/back comparison inspection are realized.
■Inspection method
・Inline real-time method: Receives BMP data/TIFF data from the printer in real time and inspects it with the camera image.
・Offline-specific RIP method: Offline inspection in which PDF for printing is converted to TIFF/BMP data and inspected using software such as Text & Graphic Co., Ltd.
■Types of pattern inspection equipment
As a pattern inspection device method, the system is divided depending on the registration/type of correct answer data (BMP format/TIFF format).
■Picture inspection field
Based on the correct answer data, it can be divided into two areas: testing for slots and fixed patterns, and testing for variable patterns.
■Inline RIP method
・Inline pattern inspection: Inspection based on BMP data from the printer
・A pattern inspection device that compares the image data generated by the printer RIP with the bitmap data from the printer and the image captured by the CIS camera. Since the bitmap data from the printer is used as the correct data, fully variable inspection can be achieved.
Different RIP method
■Offline pattern inspection
*Convert and inspect PDF data
■Picture inspection device with image data generated by another RIP
・Convert the PDF for printing into image inspection data (TIFF data) for inspection using a separate RIP, and perform a comparison inspection with the image captured by the CIS camera.
・Separate lip device must be prepared separately.
■Other inspection functions
In addition to pattern inspection, the bitmap inspection device can simultaneously perform readability inspection of OCR, barcodes, and QR codes.
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Product
Bitmap inspection device
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Handling Company
Micro Technica Co., Ltd.
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Categories
1 Models of Bitmap inspection device
| Product Image | Part Number | Price (excluding tax) |
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Bitmap inspection device |
Available upon quote |
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About Company Handling This Product
- Japan