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Cross section sample preparation device Cooling cross section polisher™ IB-19520CCP-IB-19520CCP
Cross section sample preparation device Cooling cross section polisher™ IB-19520CCP-Cosmo Trading Co., Ltd.

Cross section sample preparation device Cooling cross section polisher™ IB-19520CCP
Cosmo Trading Co., Ltd.

Cosmo Trading Co., Ltd.'s Response Status

Response Rate

100.0%

Response Time

24.3hours

Relatively Fast Response


About This Product

By cooling the sample with liquid nitrogen during processing, thermal damage caused by the ion beam can be reduced. The structure has a long cooling retention time and reduces consumption of liquid nitrogen. Samples can be cooled, returned to room temperature, and removed in a short period of time while still containing liquid nitrogen. It is equipped with a transport mechanism to perform everything from processing to observation in an environment that is not exposed to the atmosphere. Features

■Automatic machining program

High-speed machining and finishing machining can be programmed. High-quality cross sections can be produced in a short time. In addition, the intermittent machining program allows machining to be performed at lower machining temperatures.

■Automatic processing start mode/Automatic cooling processing start mode

After reaching the set pressure value and cooling temperature, processing can be started automatically. In addition, after the cooling process is completed, the temperature can be automatically returned to room temperature.

■Intermittent machining mode

By repeating ion beam irradiation and stopping at regular intervals, it is possible to suppress the temperature rise of the sample. It can also be used in conjunction with the cooling function.

■Finishing mode

After machining with high accelerating voltage, it automatically switches to machining with low accelerating voltage, making it possible to produce high-quality cross sections in a short time. It is especially effective for preparing samples for crystal structure analysis.

■Multi-purpose stage

By selecting various functional holders, it is possible to expand not only cross-sectional milling, but also plane milling, rotary cross-sectional milling, and ion beam sputter coating functions.

■Cooling function

Cooling effect. Sample: Galvanized steel sheet

■Cooling using temperature adjustment mechanism

Sample: Si wafer adhesive surface

■Suitable for various sample processing by using intermittent processing, cooling function, and temperature adjustment cooling function.

Sample processing is possible by using three functions according to the sample.

■Atmospheric non-exposure function

Using a transfer vessel, everything from processing to observation can be performed in an environment without exposure to the atmosphere.

  • Product

    Cross section sample preparation device Cooling cross section polisher™ IB-19520CCP

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1 Models of Cross section sample preparation device Cooling cross section polisher™ IB-19520CCP

Image Part Number Price (excluding tax) Power supply Intermittent machining mode Sample movement range Sample cooling retention time Sample cooling time to reach -100℃ Sample stage cooling temperature reached Sample swing function Automatic machining start mode Automatic cooling process start mode/automatic room temperature return mode Maximum power consumption Maximum loadable sample size Cross-section milling (width x length x thickness mm) Maximum loadable sample size Flat milling (mm) How to operate Ground terminal Wide cross-section milling mode Dimensions/mass (main body) (mm) Dimensions/mass (rotary pump) (mm) Room temperature/humidity Atmospheric non-exposure function External monitor output Camera magnification for processing observation Machining alignment method Cooling temperature setting range Camera magnification for positioning Finishing mode Milling speed Preset function Ion accelerating voltage Argon gas
Cross section sample preparation device Cooling cross section polisher™ IB-19520CCP-Part Number-IB-19520CCP

IB-19520CCP

Available upon quote

Single phase AC100~120V, 50/60Hz, allowable input voltage fluctuation 10% or less, equipment rating 15A or more

Ion beam irradiation time and stop time can be set (ON: 1~999 seconds, OFF: 1~999 seconds)

X-axis: ±6mm, Y-axis: ±2.5mm

8 hours or more

Within 60 minutes

-120℃ or less

±30° automatic swing mode, arbitrary angle setting mode

650VA

11×8×3 (standard accessory sample holder)
25×15×10 (Option: Wide area processing holder IB-11730LMH)

40 (diameter) x 15 (thickness) (option: large sample rotating holder IB-11550LSRH)

Touch panel, 6.5-inch display

Class D grounding (100Ω or less)

Maximum processing width: 8mm (option: wide area processing holder IB-11730LMH)

690 (width) x 720 (depth) x 530 (height), approximately 75 kg

120 (width) x 288.5 (depth) x 163 (height), approximately 9.3 kg

15~25℃/60% or less (no condensation)

The positioning camera and processing observation camera can be switched and displayed on an external monitor (when EC-10020VST is installed)

Approximately ×20~×100 (on 6.5-inch display)

Monitor the sample stage with a camera
Processing position can be adjusted even under an optical microscope

-120~0℃

Approx. x 70 (on 6.5-inch display)

Automatically changes processing conditions

500μm/h or more (acceleration voltage 8kV)

4 presets of machining conditions (acceleration voltage, argon gas flow rate, machining time, intermittent machining)

2~8kV

Purity of 99.9999% or higher recommended
Working pressure: 0.1~0.2MPa (1.0~2.0kgf/cm2) Hose connection port: JIS B 0203 Rc 1/4

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About Company Handling This Product

Response Rate

100.0%


Response Time

24.3hrs


Company Review

4.0
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